ZHCSFV6E august   2016  – november 2020 DS90UB933-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
    1.     Pin Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Recommended Serializer Timing For PCLK
    7. 6.7  AC Timing Specifications (SCL, SDA) - I2C-Compatible
    8. 6.8  Bidirectional Control Bus DC Timing Specifications (SCL, SDA) - I2C-Compatible
    9. 6.9  Serializer Switching Characteristics
    10. 6.10 Timing Diagrams
    11. 6.11 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Serial Frame Format
      2. 7.3.2 Line Rate Calculations for the DS90UB933/934
      3. 7.3.3 Error Detection
      4. 7.3.4 Synchronizing Multiple Cameras
      5. 7.3.5 General Purpose I/O (GPIO) Descriptions
      6. 7.3.6 LVCMOS V(VDDIO) Option
      7. 7.3.7 Pixel Clock Edge Select (TRFB / RRFB)
      8. 7.3.8 Power Down
    4. 7.4 Device Functional Modes
      1. 7.4.1 DS90UB933/934 Operation With External Oscillator as Reference Clock
      2. 7.4.2 DS90UB933/934 Operation With Pixel Clock From Imager as Reference Clock
      3. 7.4.3 MODE Pin on Serializer
      4. 7.4.4 Internal Oscillator
      5. 7.4.5 Built-In Self Test
      6. 7.4.6 BIST Configuration and Status
      7. 7.4.7 Sample BIST Sequence
    5. 7.5 Programming
      1. 7.5.1 Programmable Controller
      2. 7.5.2 Description of Bidirectional Control Bus and I2C Modes
      3. 7.5.3 I2C Pass-Through
      4. 7.5.4 Slave Clock Stretching
      5. 7.5.5 IDX Address Decoder on the Serializer
      6. 7.5.6 Multiple Device Addressing
    6. 7.6 Register Maps
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Power Over Coax
      2. 8.1.2 Power-Up Requirements and PDB Pin
      3. 8.1.3 AC Coupling
      4. 8.1.4 Transmission Media
    2. 8.2 Typical Applications
      1. 8.2.1 Coax Application
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 STP Application
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
        3. 8.2.2.3 62
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Interconnect Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 支持资源
    4. 11.4 Trademarks
    5. 11.5 静电放电警告
    6. 11.6 术语表

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.4.7 Sample BIST Sequence

  • Step 1: For the DS90UB933/934 FPD-Link III chipset, BIST mode is enabled via the BISTEN pin of DS90UB934-Q1 FPD-Link III deserializer. The desired clock source is selected through the deserializer GPIO0 and GPIO1 pins as shown in Table 7-4.
  • Step 2: The DS90UB933-Q1 serializer BIST pattern is enabled through the back channel. The BIST pattern is sent through the FPD-Link III to the deserializer. Once the serializer and deserializer are in the BIST mode and the deserializer acquires lock, the PASS pin of the deserializer goes high, and BIST starts checking the FPD-Link III serial stream. If an error in the payload is detected, the PASS pin switches low for one half of the clock period. During the BIST test, the PASS output can be monitored and counted to determine the payload error rate.
  • Step 3: To stop the BIST mode, the deserializer BISTEN pin is set LOW. The deserializer stops checking the data. The final test result is not maintained on the PASS pin. To monitor the BIST status, check the BIST Error Count register, 0x57 on the deserializer.
  • Step 4: The link returns to normal operation after the deserializer BISTEN pin is low. Figure 7-8 shows the waveform diagram of a typical BIST test for two cases. Case 1 is error free, and Case 2 shows one with multiple errors. In most cases, it is difficult to generate errors due to the robustness of the link (differential data transmission, etc.); thus, they may be introduced by greatly extending the cable length, faulting the interconnect, or by reducing signal condition enhancements (Rx equalization).
GUID-82396E9C-BA53-4270-8334-600C4DD46FF5-low.gifFigure 7-7 At-Speed BIST System Flow Diagram
GUID-44F59E94-C82A-4545-B257-87842A9AF434-low.gifFigure 7-8 BIST Timing Diagram