ZHCSCX0D January   2014  – October 2017 ADC12J1600 , ADC12J2700

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     旁路 — 频谱响应 ƒS = 2.7GHz，FIN = 1897MHz（–1dBFS 时）
  4. 4 修订历史记录
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Internal Characteristics
    8. 6.8 Switching Characteristics
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Signal Acquisition
      2. 7.3.2 The Analog Inputs
        1. 7.3.2.1 Input Clamp
        2. 7.3.2.2 AC Coupled Input Usage
        3. 7.3.2.3 DC Coupled Input Usage
        4. 7.3.2.4 Handling Single-Ended Input Signals
      3. 7.3.3 Clocking
      4. 7.3.4 Over-Range Function
      5. 7.3.5 ADC Core Features
        1. 7.3.5.1 The Reference Voltage
        2. 7.3.5.2 Common-Mode Voltage Generation
        3. 7.3.5.3 Bias Current Generation
        4. 7.3.5.4 Full Scale Range Adjust
        5. 7.3.5.5 Offset Adjust
        6. 7.3.5.6 Power-Down
        7. 7.3.5.7 Built-In Temperature Monitor Diode
      6. 7.3.6 Digital Down Converter (DDC)
        1. 7.3.6.1 NCO/Mixer
        2. 7.3.6.2 NCO Settings
          1. 7.3.6.2.1 NCO Frequency Phase Selection
          2. 7.3.6.2.2 NCO_0, NCO_1, and NCO_2 (NCO_x)
          3. 7.3.6.2.3 NCO_SEL Bits (2:0)
          4. 7.3.6.2.4 NCO Frequency Setting (Eight Total)
            1. 7.3.6.2.4.1 Basic NCO Frequency-Setting Mode
            2. 7.3.6.2.4.2 Rational NCO Frequency Setting Mode
          5. 7.3.6.2.5 NCO Phase-Offset Setting (Eight Total)
          6. 7.3.6.2.6 Programmable DDC Delay
        3. 7.3.6.3 Decimation Filters
        4. 7.3.6.4 DDC Output Data
        5. 7.3.6.5 Decimation Settings
          1. 7.3.6.5.1 Decimation Factor
          2. 7.3.6.5.2 DDC Gain Boost
      7. 7.3.7 Data Outputs
        1. 7.3.7.1 The Digital Outputs
        2. 7.3.7.2 JESD204B Interface Features and Settings
          1. 7.3.7.2.1  Scrambler Enable
          2. 7.3.7.2.2  Frames Per Multi-Frame (K-1)
          3. 7.3.7.2.3  DDR
          4. 7.3.7.2.4  JESD Enable
          5. 7.3.7.2.5  JESD Test Modes
          6. 7.3.7.2.6  Configurable Pre-Emphasis
          7. 7.3.7.2.7  Serial Output-Data Formatting
          8. 7.3.7.2.8  JESD204B Synchronization Features
          9. 7.3.7.2.9  SYSREF
          10. 7.3.7.2.10 SYNC~
          11. 7.3.7.2.11 Time Stamp
          12. 7.3.7.2.12 Code-Group Synchronization
          13. 7.3.7.2.13 Multiple ADC Synchronization
    4. 7.4 Device Functional Modes
      1. 7.4.1 DDC Bypass Mode
      2. 7.4.2 DDC Modes
      3. 7.4.3 Calibration
        1. 7.4.3.1 Foreground Calibration Mode
        2. 7.4.3.2 Background Calibration Mode
      4. 7.4.4 Timing Calibration Mode
      5. 7.4.5 Test-Pattern Modes
        1. 7.4.5.1 ADC Test-Pattern Mode
        2. 7.4.5.2 Serializer Test-Mode Details
        3. 7.4.5.3 PRBS Test Modes
        4. 7.4.5.4 Ramp Test Mode
        5. 7.4.5.5 Short and Long-Transport Test Mode
        6. 7.4.5.6 D21.5 Test Mode
        7. 7.4.5.7 K28.5 Test Mode
        8. 7.4.5.8 Repeated ILA Test Mode
        9. 7.4.5.9 Modified RPAT Test Mode
    5. 7.5 Programming
      1. 7.5.1 Using the Serial Interface
        1. 7.5.1.1 Streaming Mode
    6. 7.6 Register Map
      1. 7.6.1 Memory Map
      2. 7.6.2 Register Descriptions
        1. 7.6.2.1 Standard SPI-3.0 (0x000 to 0x00F)
          1. Table 40. Standard SPI-3.0 Registers
          2. 7.6.2.1.1  Configuration A Register (address = 0x000) [reset = 0x3C]
            1. Table 41. CFGA Field Descriptions
          3. 7.6.2.1.2  Configuration B Register (address = 0x001) [reset = 0x00]
            1. Table 42. CFGB Field Descriptions
          4. 7.6.2.1.3  Device Configuration Register (address = 0x002) [reset = 0x00]
            1. Table 43. DEVCFG Field Descriptions
          5. 7.6.2.1.4  Chip Type Register (address = 0x003) [reset = 0x03]
            1. Table 44. CHIP_TYPE Field Descriptions
          6. 7.6.2.1.5  Chip Version Register (address = 0x006) [reset = 0x13]
            1. Table 45. CHIP_VERSION Field Descriptions
          7. 7.6.2.1.6  Vendor Identification Register (address = 0x00C to 0x00D) [reset = 0x0451]
            1. Table 46. VENDOR_ID Field Descriptions
        2. 7.6.2.2 User SPI Configuration (0x010 to 0x01F)
          1. 7.6.2.2.1 User SPI Configuration Register (address = 0x010) [reset = 0x00]
            1. Table 48. USR0 Field Descriptions
        3. 7.6.2.3 General Analog, Bias, Band Gap, and Track and Hold (0x020 to 0x02F)
          1. 7.6.2.3.1 Power-On Reset Register (address = 0x021) [reset = 0x00]
            1. Table 50. POR Field Descriptions
          2. 7.6.2.3.2 I/O Gain 0 Register (address = 0x022) [reset = 0x40]
            1. Table 51. IO_GAIN_0 Field Descriptions
          3. 7.6.2.3.3 IO_GAIN_1 Register (address = 0x023) [reset = 0x00]
            1. Table 52. IO_GAIN_1 Field Descriptions
          4. 7.6.2.3.4 I/O Offset 0 Register (address = 0x025) [reset = 0x40]
            1. Table 53. IO_OFFSET_0 Field Descriptions
          5. 7.6.2.3.5 I/O Offset 1 Register (address = 0x026) [reset = 0x00]
            1. Table 54. IO_OFFSET_1 Field Descriptions
        4. 7.6.2.4 Clock (0x030 to 0x03F)
          1. 7.6.2.4.1 Clock Generator Control 0 Register (address = 0x030) [reset = 0xC0]
            1. Table 56. CLKGEN_0 Field Descriptions
          2. 7.6.2.4.2 Clock Generator Status Register (address = 0x031) [reset = 0x07]
            1. Table 57. CLKGEN_1 Field Descriptions
          3. 7.6.2.4.3 Clock Generator Control 2 Register (address = 0x032) [reset = 0x80]
            1. Table 58. CLKGEN_2 Field Descriptions
          4. 7.6.2.4.4 Analog Miscellaneous Register (address = 0x033) [reset = 0xC3]
            1. Table 59. ANA_MISC Field Descriptions
          5. 7.6.2.4.5 Input Clamp Enable Register (address = 0x034) [reset = 0x2F]
            1. Table 60. IN_CL_EN Field Descriptions
        5. 7.6.2.5 Serializer (0x040 to 0x04F)
          1. 7.6.2.5.1 Serializer Configuration Register (address = 0x040) [reset = 0x04]
            1. Table 62. SER_CFG Field Descriptions
        6. 7.6.2.6 ADC Calibration (0x050 to 0x1FF)
          1. 7.6.2.6.1 Calibration Configuration 0 Register (address = 0x050) [reset = 0x06]
            1. Table 64. CAL_CFG0 Field Descriptions
          2. 7.6.2.6.2 Calibration Configuration 1 Register (address = 0x051) [reset = 0xF4]
            1. Table 65. CAL_CFG1 Field Descriptions
          3. 7.6.2.6.3 Calibration Background Control Register (address = 0x057) [reset = 0x10]
            1. Table 66. CAL_BACK Field Descriptions
          4. 7.6.2.6.4 ADC Pattern and Over-Range Enable Register (address = 0x058) [reset = 0x00]
            1. Table 67. ADC_PAT_OVR_EN Field Descriptions
          5. 7.6.2.6.5 Calibration Vectors Register (address = 0x05A) [reset = 0x00]
            1. Table 68. CAL_VECTOR Field Descriptions
          6. 7.6.2.6.6 Calibration Status Register (address = 0x05B) [reset = undefined]
            1. Table 69. CAL_STAT Field Descriptions
          7. 7.6.2.6.7 Timing Calibration Register (address = 0x066) [reset = 0x02]
            1. Table 70. CAL_STAT Field Descriptions
        7. 7.6.2.7 Digital Down Converter and JESD204B (0x200-0x27F)
          1. 7.6.2.7.1  Digital Down-Converter (DDC) Control Register (address = 0x200) [reset = 0x10]
            1. Table 72. DDC_CTRL1 Field Descriptions
          2. 7.6.2.7.2  JESD204B Control 1 Register (address = 0x201) [reset = 0x0F]
            1. Table 73. JESD_CTRL1 Field Descriptions
          3. 7.6.2.7.3  JESD204B Control 2 Register (address = 0x202) [reset = 0x00]
            1. Table 74. JESD_CTRL2 Field Descriptions
          4. 7.6.2.7.4  JESD204B Device ID (DID) Register (address = 0x203) [reset = 0x00]
            1. Table 75. JESD_DID Field Descriptions
          5. 7.6.2.7.5  JESD204B Control 3 Register (address = 0x204) [reset = 0x00]
            1. Table 76. JESD_CTRL3 Field Descriptions
          6. 7.6.2.7.6  JESD204B and System Status Register (address = 0x205) [reset = Undefined]
            1. Table 77. JESD_STATUS Field Descriptions
          7. 7.6.2.7.7  Overrange Threshold 0 Register (address = 0x206) [reset = 0xF2]
            1. Table 78. OVR_T0 Field Descriptions
          8. 7.6.2.7.8  Overrange Threshold 1 Register (address = 0x207) [reset = 0xAB]
            1. Table 79. OVR_T1 Field Descriptions
          9. 7.6.2.7.9  Overrange Period Register (address = 0x208) [reset = 0x00]
            1. Table 80. OVR_N Field Descriptions
          10. 7.6.2.7.10 DDC Configuration Preset Mode Register (address = 0x20C) [reset = 0x00]
            1. Table 81. NCO_MODE Field Descriptions
          11. 7.6.2.7.11 DDC Configuration Preset Select Register (address = 0x20D) [reset = 0x00]
            1. Table 82. NCO_SEL Field Descriptions
          12. 7.6.2.7.12 Rational NCO Reference Divisor Register (address = 0x20E to 0x20F) [reset = 0x0000]
            1. Table 83. NCO_RDIV Field Descriptions
          13. 7.6.2.7.13 NCO Frequency (Preset x) Register (address = see ) [reset = see ]
            1. Table 84. NCO_FREQ_x Field Descriptions
          14. 7.6.2.7.14 NCO Phase (Preset x) Register (address = see ) [reset = see ]
            1. Table 85. NCO_PHASE_x Field Descriptions
          15. 7.6.2.7.15 DDC Delay (Preset x) Register (address = see ) [reset = see ]
            1. Table 86. DDC_DLY_x Field Descriptions
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 RF Sampling Receiver
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Oscilloscope
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
        3. 8.2.2.3 Application Curves
    3. 8.3 Initialization Set-Up
      1. 8.3.1 JESD204B Startup Sequence
    4. 8.4 Dos and Don'ts
      1. 8.4.1 Common Application Pitfalls
  9. 9 Power Supply Recommendations
    1. 9.1 Supply Voltage
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
    3. 10.3 Thermal Management
  11. 11器件和文档支持
    1. 11.1 器件支持
      1. 11.1.1 Third-Party Products Disclaimer
      2. 11.1.2 开发支持
      3. 11.1.3 器件命名规则
    2. 11.2 文档支持
      1. 11.2.1 相关文档
    3. 11.3 相关链接
    4. 11.4 社区资源
    5. 11.5 商标
    6. 11.6 静电放电警告
    7. 11.7 Glossary
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.4.5.5 Short and Long-Transport Test Mode

The short-transport test mode is available when the device is operated in DDC bypass mode (decimation = 1). The short transport pattern has a length of one frame. Table 36 lists the formula followed by each sample of the pattern.

Table 36. Short Transport Test Pattern Definition

BIT
11 10 9 8 7 6 5 4 3 2 1 0
~LID LID SID+1

LID is the lane ID (0 to 7) and SID is the sample number within the frame (0 to 4). The entire pattern has a length of one frame and is listed in Table 37.

Table 37. Short Transport Test Pattern

LANE (CONVERTER ID)SAMPLE NUMBER (SID)
01234
0 0xF01 0xF02 0xF03 0xF04 0xF05
1 0xE11 0xE12 0xE13 0xE14 0xE15
2 0xD21 0xD22 0xD23 0xD24 0xD25
3 0xC31 0xC32 0xC33 0xC34 0xC35
4 0xB41 0xB42 0xB43 0xB44 0xB45
5 0xA51 0xA52 0xA53 0xA54 0xA55
6 0x961 0x962 0x963 0x964 0x965
7 0x871 0x872 0x873 0x874 0x875

The long-transport test mode is available in all DDC modes (decimation > 1). Patterns are generated in accordance with the JESD204B standard and are different for each output format.

Table 38 lists one example of the long transport test pattern:

Table 38. Long Transport Test Pattern - Decimate-by-4, DDR = 1, P54 = 1, K=10

TIME →
CHAR NO.0123456789101112131415161718192021
Lane 0 0x0003 0x0002 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x0003
Lane 1 0x0002 0x0005 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x0002
Lane 2 0x0004 0x0002 0x8001 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x0004
Lane 3 0x0004 0x0004 0x8000 0x8001 0x8000 0x8000 0x8000 0x8000 0x8000 0x8000 0x0004
Frame
n		 Frame
n + 1		 Frame
n + 2		 Frame
n + 3		 Frame
n + 4		 Frame
n + 5		 Frame
n + 6		 Frame
n + 7		 Frame
n + 8		 Frame
n + 9		 Frame
n + 10

If multiple devices are all programmed to the transport layer test mode (while JESD_EN = 0), then JESD_EN is set to 1, and then SYSREF is used to align the LMFC of the devices, the patterns will be aligned to the SYSREF event (within the skew budget of JESD204B). For more details see JESD204B, section 5.1.6.3.