SNAS411P August   2008  – April 2017 ADC128S102QML-SP

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: ADC128S102QML-SP Converter
    6. 6.6 Electrical Characteristics: Radiation
    7. 6.7 Electrical Characteristics: Burn in Delta Parameters - TA at 25°C
    8. 6.8 Timing Requirements
    9. 6.9 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 ADC128S102 Transfer Function
      2. 7.3.2 Analog Inputs
      3. 7.3.3 Digital Inputs and Outputs
      4. 7.3.4 Radiation Environments
        1. 7.3.4.1 Total Ionizing Dose
        2. 7.3.4.2 Single Event Latch-Up and Functional Interrupt
        3. 7.3.4.3 Single Event Upset
    4. 7.4 Device Functional Modes
      1. 7.4.1 ADC128S102 Operation
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
  9. Power Supply Recommendations
    1. 9.1 Power Supply Sequence
    2. 9.2 Power Management
    3. 9.3 Power Supply Noise Considerations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
      2. 11.1.2 Device Nomenclature
        1. 11.1.2.1 Specification Definitions
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Community Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Engineering Samples

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Application and Implementation

NOTE

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.

Application Information

The ADC128S102 device is a low-power, eight-channel 12-bit ADC with ensured performance specifications from 50 kSPS to 1 MSPS. It is appropriate to utilize the ADC128S102 at sample rates below 50 kSPS by powering the device down (de-asserting CSB) in between conversions. The Electrical Characteristics information highlights the clock frequency where the ADC’s performance is ensured. There is no limitation on periods of time for shutdown between conversions.

Typical Application

A typical application is shown in Figure 38. The split analog and digital supply pins are both powered in this example by the Texas Instruments LP2950-N low-dropout voltage regulator. The analog supply is bypassed with a capacitor network located close to the ADC128S102. The digital supply is separated from the analog supply by an isolation resistor and bypassed with additional capacitors. The ADC128S102 uses the analog supply (VA) as its reference voltage, so it is very important that VA be kept as clean as possible. Due to the low power requirements of the ADC128S102, it is also possible to use a precision reference as a power supply.

ADC128S102QML-SP 30018113.gif Figure 38. Typical Application Circuit

Design Requirements

A positive supply only data acquisition system capable of digitizing up to eight single-ended input signals ranging from 0 to 5 V with BW = 10 kHz and a throughput up to 500 kSPS. The ADC128S102 has to interface to an MCU whose supply is set at 5 V. If it is necessary to interface with an MCU that operates at 3.3 V or lower, VA and VD will need to be separated and care must be taken to ensure that VA is powered before VD.

Detailed Design Procedure

The signal range requirement forces the design to use 5-V analog supply at VA, analog supply. This follows from the fact that VA is also a reference potential for the ADC. If the requirement of interfacing to the MCU changes to 3.3-V, it will be necessary to change the VD supply voltage to 3.3 V. The maximum sampling rate of the ADC128S102 when all channels (eight) are enabled is, Fs = FSCLK / (16 × 8).

Note that faster sampling rates can be achieved when fewer channels are sampled. Single channel can be sampled at the maximum rate of Fs (single) = FSCLK / 16.

The VA and VD pins are separated by a 51-Ω resistor in order to minimize digital noise from corrupting the analog reference input. If additional filtering is required, the resistor can be replaced by a ferrite bead, thus achieving a 2nd-order filter response. Further noise consideration could be given to the SPI interface, especially when the master MCU is capable of producing fast rising edges on the digital bus signals. Inserting small resistances in the digital signal path may help in reducing the ground bounce, and thus improve the overall noise performance of the system. Care should be taken when the signal source is capable of producing voltages beyond VA. In such instances, the internal ESD diodes may start conducting. The ESD diodes are not intended as input signal clamps. To provide the desired clamping action use Schottky diodes.

Application Curve

ADC128S102QML-SP 30018154.png Figure 39. ENOB vs Temperature