TPD1S414
- Overvoltage Protection at VBUS_CON Up to 30-V DC
- Low RON nFET Switch Supports Host and Charging Mode
- Internal 15-ms Start-Up Delay
- Internal 30-ms Soft-Start Delay to Minimize the USB Inrush Current
- Transient Protection for VBUS Line:
- IEC 61000-4-2 Contact Discharge ±15 kV
- IEC 61000-4-2 Air Gap Discharge ±15 kV
- IEC 61000-4-5 Open-Circuit Voltage 100 V
- Integrated Input Enable and Status Output Signal
- Thermal Shutdown (TSD) Feature
- Space-Saving DSBGA Package: (1.4 mm × 1.89 mm)
The TPD1S414 device is a single-chip solution for a USB connector’s VBUS line protection. The bidirectional nFET switch ensures safe current flow in both charging and host mode while protecting the internal system circuits from any overvoltage conditions at the VBUS_CON pin. On the VBUS_CON pin, this device can handle overvoltage protection up to 30 V. After the EN pin toggles low, the TPD1S414 waits 20 ms before turning ON the nFET through a soft-start delay. ACK pin indicates the FET is completely turned ON.
The typical application interface for the TPD1S414 is the VBUS line in USB connectors. Typical end equipment for TPD1S414 are mobiles phones, tablets, wearables, and electronic-point-of-sale (EPOS). The TPD1S414 can also be applied to any system using an interface with a 5-V power rail.
技术文档
| 顶层文档 | 类型 | 标题 | 格式选项 | 下载最新的英语版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 数据表 | TPD1S414 USB Charger Overvoltage, Surge, and ESD Protection for VBUS Pin 数据表 (Rev. B) | PDF | HTML | 2015-11-29 | ||
| 选择指南 | System-Level ESD Protection Guide (Rev. E) | PDF | HTML | 2025-8-5 | |||
| 用户指南 | 阅读并了解 ESD 保护数据表 (Rev. A) | PDF | HTML | 英语版 (Rev.A) | PDF | HTML | 2023-9-22 | |
| 应用手册 | ESD 保护布局指南 (Rev. A) | PDF | HTML | 英语版 (Rev.A) | PDF | HTML | 2022-7-25 | |
| 白皮书 | Designing USB for short-to-battery tolerance in automotive environments | 2016-2-10 | ||||
| 模拟设计期刊 | 系统级 ESD 电路保护的设计注意事项 | 英语版 | 2012-12-6 |
设计与开发
如需其他信息或资源，请点击以下任一标题进入详情页面查看（如有）。
TPD1S414EVM — TPD1S414EVM - 具有 ESD 保护的 USB 充电器过压 OVP 开关评估模块
The TPD1S414EVM includes 4 TPD1S414YZ’s in various configurations for testing. Three of the TPD1S414YZ’s are configured for IEC61000-4-5 (8/20 μs) compliance testing; one TPD1S414YZ is configured for throughput on USB 2.0 Type A connectors for throughput analysis.
| 封装 | 引脚 | CAD 符号、封装和 3D 模型 |
|---|---|---|
| DSBGA (YZ) | 12 | Ultra Librarian |