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TLV1822-Q1 正在供货 汽车类、双通道、微功耗高压开漏比较器 Improved performance: wider supply voltage, lower offset voltage and faster speed

产品详情

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 16 Vs (min) (V) 4 Rating Automotive Iq per channel (typ) (mA) 0.011 Vos (offset voltage at 25°C) (max) (mV) 5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 0.03 VICR (max) (V) 15 VICR (min) (V) 0
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 16 Vs (min) (V) 4 Rating Automotive Iq per channel (typ) (mA) 0.011 Vos (offset voltage at 25°C) (max) (mV) 5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 0.03 VICR (max) (V) 15 VICR (min) (V) 0
SOIC (D) 8 29.4 mm² (4.9 mm × 6 mm)
  • Qualified for Automotive Applications
  • AEC Q100 Qualified with the Following Results:
    • Device Temperature Grade 1: –40°C to 125°C
      Ambient Operating Temperature Range
    • Device HBM ESD Classification Level H2
    • Device CDM ESD Classification Level C4B
  • ESD Protection Exceeds 500 V Per
    MIL-STD-883, Method 3015; Exceeds 50 V
    Using Machine Model (C = 200 pF, R = 0)
  • Low Power: 110 µW Typ at 5 V
  • Fast Response Time: tPLH = 2.5 µs Typ With
    5-mV Overdrive
  • Single Supply Operation:
    • TLC393Q: 4 V to 16 V
  • Qualified for Automotive Applications
  • AEC Q100 Qualified with the Following Results:
    • Device Temperature Grade 1: –40°C to 125°C
      Ambient Operating Temperature Range
    • Device HBM ESD Classification Level H2
    • Device CDM ESD Classification Level C4B
  • ESD Protection Exceeds 500 V Per
    MIL-STD-883, Method 3015; Exceeds 50 V
    Using Machine Model (C = 200 pF, R = 0)
  • Low Power: 110 µW Typ at 5 V
  • Fast Response Time: tPLH = 2.5 µs Typ With
    5-mV Overdrive
  • Single Supply Operation:
    • TLC393Q: 4 V to 16 V

The TLC393 consists of dual independent micropower voltage comparators designed to operate from a single supply. It is functionally similar to the LM393 but uses one-twentieth the power for similar response times. The open-drain MOS output stage interfaces to a variety of loads and supplies. For a similar device with a push-pull output configuration see the TLC3702 data sheet.

Texas Instruments LinCMOS process offers superior analog performance to standard CMOS processes. Along with the standard CMOS advantages of low power without sacrificing speed, high input impedance, and low bias currents, the LinCMOS™ process offers extremely stable input offset voltages, even with differential input stresses of several volts. This characteristic makes it possible to build reliable CMOS comparators.

The TLC393Q is characterized for operation over the full automotive temperature range of TA = −40°C to 125°C

The TLC393 consists of dual independent micropower voltage comparators designed to operate from a single supply. It is functionally similar to the LM393 but uses one-twentieth the power for similar response times. The open-drain MOS output stage interfaces to a variety of loads and supplies. For a similar device with a push-pull output configuration see the TLC3702 data sheet.

Texas Instruments LinCMOS process offers superior analog performance to standard CMOS processes. Along with the standard CMOS advantages of low power without sacrificing speed, high input impedance, and low bias currents, the LinCMOS™ process offers extremely stable input offset voltages, even with differential input stresses of several volts. This characteristic makes it possible to build reliable CMOS comparators.

The TLC393Q is characterized for operation over the full automotive temperature range of TA = −40°C to 125°C

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技术文档

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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 Dual Micropower LinCMOS Voltage Comparator 数据表 (Rev. B) 2013-5-20
功能安全信息 TLC393-Q1 Functional Safety FIT Rate, Failure Mode Distribution 2020-2-25
电子书 The Signal e-book: 有关运算放大器设计主题的博客文章汇编 PDF | HTML 英语版 PDF | HTML 2018-1-31

设计与开发

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评估板

AMP-PDK-EVM — 放大器高性能开发套件评估模块

放大器高性能开发套件 (PDK) 是一款用于测试常见运算放大器参数的评估模块 (EVM) 套件,与大多数运算放大器和比较器均兼容。该 EVM 套件提供了一个主板,主板上具有多个插槽式子卡选项以满足封装需求,使工程师能够快速评估和验证器件性能。

AMP-PDK-EVM 套件支持五种常用的业界通用封装,包括:

  • D(SOIC-8 和 SOIC-14)
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV(SOT23-5 和 SOT23-6)
  • DCK(SC70-5 和 SC70-6)
用户指南: PDF | HTML
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仿真模型

TLC393 PSpice Model

SLCJ029.ZIP (0 KB) - PSpice 模型
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封装 引脚 CAD 符号、封装和 3D 模型
SOIC (D) 8 Ultra Librarian

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