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SN74HC02-EP

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增强型产品 4 通道、2 输入、2V 至 6V 或非门

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SN74HC02-EP

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产品详情

Technology family HC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 4 IOH (max) (mA) -4 Output type Push-Pull Input type Standard CMOS Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
Technology family HC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 4 IOH (max) (mA) -4 Output type Push-Pull Input type Standard CMOS Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 20-µA Max ICC
  • Typical tpd = 8 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 20-µA Max ICC
  • Typical tpd = 8 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.

The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.
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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 SN74HC02-EP 数据表 (Rev. A) 2004-1-6
* 辐射与可靠性报告 SN74HC02QPWREP Reliability Report 2013-9-5
* VID SN74HC02-EP VID V6204687 2016-6-21

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