产品详情

Sample rate (max) (Msps) 1000, 2000 Resolution (Bits) 10 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2800 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 2770 Architecture Folding Interpolating SNR (dB) 56.8 ENOB (Bits) 9 SFDR (dB) 67.6 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 100 Radiation, SEL (MeV·cm2/mg) 120
Sample rate (max) (Msps) 1000, 2000 Resolution (Bits) 10 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2800 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 2770 Architecture Folding Interpolating SNR (dB) 56.8 ENOB (Bits) 9 SFDR (dB) 67.6 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 100 Radiation, SEL (MeV·cm2/mg) 120
CCGA (NAA) 376 780.6436 mm² (0 mm × 0 mm)
  • Total Ionizing Dose 100 krad(Si)
  • Single Event Latch-Up 120 Mev-cm2/mg
  • Excellent Accuracy and Dynamic Performance
  • Low Power Consumption
  • R/W SPI Interface for Extended Control Mode
  • Internally Terminated, Buffered, Differential Analog Inputs
  • Ability to Interleave the 2 Channels to Operate 1 Channel at Twice the Conversion Rate
  • Test Patterns at Output for System Debug
  • Programmable 15-Bit Gain and 12-Bit Plus Sign Offset Adjustments
  • Option of 1:2 Demuxed or 1:1 Non-demuxed LVDS Outputs
  • Auto-sync Feature for Multi-chip Systems
  • Single 1.9 ±0.1-V Power Supply
  • 376 Ceramic Pin Grid Array Package (28.2 mm x 28.2 mm x 3.1 mm with 1.27 mm ball-pitch)
  • Total Ionizing Dose 100 krad(Si)
  • Single Event Latch-Up 120 Mev-cm2/mg
  • Excellent Accuracy and Dynamic Performance
  • Low Power Consumption
  • R/W SPI Interface for Extended Control Mode
  • Internally Terminated, Buffered, Differential Analog Inputs
  • Ability to Interleave the 2 Channels to Operate 1 Channel at Twice the Conversion Rate
  • Test Patterns at Output for System Debug
  • Programmable 15-Bit Gain and 12-Bit Plus Sign Offset Adjustments
  • Option of 1:2 Demuxed or 1:1 Non-demuxed LVDS Outputs
  • Auto-sync Feature for Multi-chip Systems
  • Single 1.9 ±0.1-V Power Supply
  • 376 Ceramic Pin Grid Array Package (28.2 mm x 28.2 mm x 3.1 mm with 1.27 mm ball-pitch)

The ADC10D1000 is the latest advance in TI's Ultra-High-Speed ADC family of products. This low-power, high-performance CMOS analog-to-digital converter digitizes signals at 10-bit resolution at sampling rates of up to 1.0 GSPS in dual channel mode or 2.0 GSPS in single channel mode. The ADC10D1000 achieves excellent accuracy and dynamic performance while consuming a typical 2.9 W of power. This space grade, Radiation Tolerant part is rad hard to a single event latch up level of greater than 120MeV and a total dose (TID) of 100 krad(Si). The product is packaged in a hermatic 376 column thermally enhanced CPGA package rated over the temperature range of -55°C to +125°C.

The ADC10D1000 builds upon the features, architecture and functionality of the 8-bit GHz family of ADCs. New features include an auto-sync feature for multi-chip synchronization, independent programmable15-bit gain and 12-bit offset adjustment per channel, LC tank filter on the clock input, and the option of two's complement format for the digital output data. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal track-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 8.9 Effective Number of Bits (ENOB) with a 498 MHz input signal and a 1.0 GHz sample rate while providing a 10−18 Code Error Rate (C.E.R.) Consuming a typical 2.9 W in Non-Demultiplex Mode at 1.0 GSPS from a single 1.9-V supply, this device is ensured to have no missing codes over the full operating temperature range.

Each channel has its own independent DDR Data Clock, DCLKI and DCLKQ, which are in phase when both channels are powered up, so that only one Data Clock could be used to capture all data, which is sent out at the same rate as the input sample clock. If the 1:2 Demultiplexed Mode is selected, a second 10-bit LVDS bus becomes active for each channel, such that the output data rate is sent out two times slower, but two times wider to relax data-capture timing margin. The two channels (I and Q) can also be interleaved (DES Mode) and used as a single 2.0 GSPS ADC to sample on the Q input. The output formatting is offset binary or two's complement and the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8 V and 1.2 V.

The ADC10D1000 is the latest advance in TI's Ultra-High-Speed ADC family of products. This low-power, high-performance CMOS analog-to-digital converter digitizes signals at 10-bit resolution at sampling rates of up to 1.0 GSPS in dual channel mode or 2.0 GSPS in single channel mode. The ADC10D1000 achieves excellent accuracy and dynamic performance while consuming a typical 2.9 W of power. This space grade, Radiation Tolerant part is rad hard to a single event latch up level of greater than 120MeV and a total dose (TID) of 100 krad(Si). The product is packaged in a hermatic 376 column thermally enhanced CPGA package rated over the temperature range of -55°C to +125°C.

The ADC10D1000 builds upon the features, architecture and functionality of the 8-bit GHz family of ADCs. New features include an auto-sync feature for multi-chip synchronization, independent programmable15-bit gain and 12-bit offset adjustment per channel, LC tank filter on the clock input, and the option of two's complement format for the digital output data. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal track-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 8.9 Effective Number of Bits (ENOB) with a 498 MHz input signal and a 1.0 GHz sample rate while providing a 10−18 Code Error Rate (C.E.R.) Consuming a typical 2.9 W in Non-Demultiplex Mode at 1.0 GSPS from a single 1.9-V supply, this device is ensured to have no missing codes over the full operating temperature range.

Each channel has its own independent DDR Data Clock, DCLKI and DCLKQ, which are in phase when both channels are powered up, so that only one Data Clock could be used to capture all data, which is sent out at the same rate as the input sample clock. If the 1:2 Demultiplexed Mode is selected, a second 10-bit LVDS bus becomes active for each channel, such that the output data rate is sent out two times slower, but two times wider to relax data-capture timing margin. The two channels (I and Q) can also be interleaved (DES Mode) and used as a single 2.0 GSPS ADC to sample on the Q input. The output formatting is offset binary or two's complement and the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8 V and 1.2 V.

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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 ADC10D1000QML Low-Power, 10-Bit, Dual 1-GSPS or Single 2-GSPS Analog-to-Digital Converter 数据表 (Rev. G) PDF | HTML 2016-12-7
* 辐射与可靠性报告 CMOS Low Dose Rate Paper 2012-5-7
* 辐射与可靠性报告 ADC10D1000CCMLS TID Report 2012-5-7
* 辐射与可靠性报告 ADC Single Event Upset Test Method 2012-5-7
* 辐射与可靠性报告 ADC10D1000CCMLS SEE Report 2012-5-7
* 辐射与可靠性报告 Analysis of Low Dose Rate Effects on Parasitic Bipolar Structures in CMOS Proces 2012-5-4
选择指南 TI Space Products (Rev. L) 2026-3-27
应用简报 经 DLA 批准的 QML 产品优化 (Rev. C) PDF | HTML 英语版 (Rev.C) PDF | HTML 2025-8-18
应用手册 重离子轨道环境单粒子效应估算 (Rev. B) PDF | HTML 英语版 (Rev.B) PDF | HTML 2025-7-7
更多文献资料 TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 2025-2-20
应用手册 单粒子效应置信区间计算 (Rev. A) PDF | HTML 英语版 (Rev.A) PDF | HTML 2022-12-2
应用简报 了解音频电路中的运算放大器噪声 PDF | HTML 英语版 PDF | HTML 2022-11-14
电子书 电子产品辐射手册 2022-5-7
应用手册 AN-2132 Synchronizing Multiple GSPS ADCs in a System: The AutoSync Feature (Rev. G) 2017-2-3
应用手册 Signal Chain Noise Figure Analysis 2014-10-29
应用手册 Synchronizing the Giga-Sample ADCs Interfaced with Multiple FPGAs 2014-8-6
应用手册 AN-2128 ADC1xD1x00 Pin Compatibility (Rev. C) 2013-5-1
应用手册 From Sample Instant to Data Output: Understanding Latency in the GSPS ADC 2012-12-18
产品概述 ADC12Dxx00RF Direct RF-Sampling ADC Family 2012-5-16

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ADC-LD-BB — ADC 低失真平衡-非平衡转换板

硬件套件中包含一个 ADC-LD-BB 板,该套件配有 GSPS 模数转换器 (ADC) 参考板。由于 ADC1xDxx00RB 的模拟输入为差分输入,并且大多数信号源为单端信号源,因此这些平衡 -非平衡转换板通常用于实现单端至差分转换。如果 I- 和 Q- 输入同时由类似信号驱动,则可能需要额外添加一块同类型的平衡-不平衡转换板。

顺带一提,该平衡-非平衡转换板也可用于进行差分至单端转换。例如,在单端示波器上观察 DCLK± 或 RCOut± 信号时,可使用此平衡-平衡转换板来探索 GSPS ADC 参考板的自动同步功能。

ADC-LD-BB 采用 Anaren® 的 (...)

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仿真模型

ADC10D1000QML IBIS Model

SNAM012.ZIP (42 KB) - IBIS 模型
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封装 引脚 CAD 符号、封装和 3D 模型
CCGA (NAA) 376 Ultra Librarian

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