SCANSTA101

正在供货

低电压 IEEE 1149.1 系统测试访问 (STA) 主设备

产品详情

Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 85
Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 85
NFBGA (NZA) 49 49 mm² (7 mm × 7 mm)
  • Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
  • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of Processors and Processor Clock (PCLK) Frequencies
  • 16-Bit Data Interface (IP Scalable to 32-bit)
  • 2k x 32 Bit Dual-Port Memory
  • Load-on-the-Fly (LotF) and Preloaded Vector Operating Modes Supported
  • On-Board Sequencer Allows Multi-Vector Operations such as those Required to Load Data Into an FPGA
  • On-Board Compares Support Test Data In (TDI) Validation Against Preloaded Expected Data
  • 32-Bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) Port for Signature Compression
  • State, Shift, and BIST Macros Allow Predetermined Test Mode Select (TMS) Sequences to be Utilized
  • Operates at 3.3 V Supply Voltages with 5 V Tolerant I/O
  • Outputs Support Power-Down TRI-STATE Mode.

All trademarks are the property of their respective owners.

  • Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
  • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of Processors and Processor Clock (PCLK) Frequencies
  • 16-Bit Data Interface (IP Scalable to 32-bit)
  • 2k x 32 Bit Dual-Port Memory
  • Load-on-the-Fly (LotF) and Preloaded Vector Operating Modes Supported
  • On-Board Sequencer Allows Multi-Vector Operations such as those Required to Load Data Into an FPGA
  • On-Board Compares Support Test Data In (TDI) Validation Against Preloaded Expected Data
  • 32-Bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) Port for Signature Compression
  • State, Shift, and BIST Macros Allow Predetermined Test Mode Select (TMS) Sequences to be Utilized
  • Operates at 3.3 V Supply Voltages with 5 V Tolerant I/O
  • Outputs Support Power-Down TRI-STATE Mode.

All trademarks are the property of their respective owners.

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices.

The SCANSTA101 improves test vector throughput and reduces software overhead in the system processor. The SCANSTA101 presents a simple, register-based interface to the system processor. Texas Instruments provides C-language source code which can be included in the embedded system software. The combination of the SCANSTA101 and its support software comprises a simple API for boundary scan operations.

The interface from the SCANSTA101 to the system processor is implemented by reading and writing registers, some of which map to locations in the SCANSTA101 memory. Hardware handshaking and interrupt lines are provided as part of the processor interface.

The SCANSTA101 is available as a stand-alone device packaged in a 49-pin NFBGA package. It is also available as an IP macro for synthesis in programmable logic devices.

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices.

The SCANSTA101 improves test vector throughput and reduces software overhead in the system processor. The SCANSTA101 presents a simple, register-based interface to the system processor. Texas Instruments provides C-language source code which can be included in the embedded system software. The combination of the SCANSTA101 and its support software comprises a simple API for boundary scan operations.

The interface from the SCANSTA101 to the system processor is implemented by reading and writing registers, some of which map to locations in the SCANSTA101 memory. Hardware handshaking and interrupt lines are provided as part of the processor interface.

The SCANSTA101 is available as a stand-alone device packaged in a 49-pin NFBGA package. It is also available as an IP macro for synthesis in programmable logic devices.

下载 观看带字幕的视频 视频

技术文档

未找到结果。请清除搜索并重试。
查看全部 3
顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master 数据表 (Rev. J) 2013-4-12
应用手册 SCANSTA101 Quick Reference Guide 2010-1-7
应用手册 JTAG Advanced Capabilities and System Design 2009-3-19

设计与开发

如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。

支持软件

EVF-WORKBENCH-CONVERTER-SW — EVF Workbench - Converts JTAG SVF to National’s EVF2 SCAN Format

Graphical User Interface tool for conversion of SVF files to National Semiconductor’s EVF2 embedded file format. Zip file includes readme file, license file, and setup program (1.6MB)
支持的产品和硬件
仿真模型

SCANSTA101 IBIS Model

SNLM006.ZIP (4 KB) - IBIS 模型
支持的产品和硬件
封装 引脚 CAD 符号、封装和 3D 模型
NFBGA (NZA) 49 Ultra Librarian

订购和质量

支持和培训

可获得 TI 工程师技术支持的 TI E2E™ 论坛

所有内容均由 TI 和社区贡献者按“原样”提供,并不构成 TI 规范。请参阅使用条款

如果您对质量、包装或订购 TI 产品有疑问,请参阅 TI 支持。​​​​​​​​​​​​​​

视频