SLVK117 October 2022 TPS7H2221-SEP
The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the TPS7H2221-SEP. SEE performance was verified at an input voltage range of 1.6-V to 5.5-V. Heavy-ions with LETEFF of 42.7 and 46.8 MeV·cm2/mg were used to irradiate 6 production devices. Flux of ≈105 ions/cm2·s and fluences of ≈107 ions/cm2 per run were used for the DSEE characterization and flux of ≈104 or 105 ions/cm2·s and fluences of ≈3 x 106 or 107 for the SET testing. The results demonstrated that the TPS7H2221-SEP is single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) -free up to 46.8 MeV·cm2/mg, at T = 125°C and T = 25°C, respectively, and across the full electrical specifications. Single event transient (SET) performance for output voltage excursions ≥ |3%| from the nominal voltage are discussed.