SLVK117 October   2022 TPS7H2221-SEP

 

  1.   Single-Event Effects Test Report of the TPS7H2221-SEP Load Switch
  2.   Trademarks
  3. 1 Introduction
  4. 2 Single-Event Effects (SEE)
  5. 3 Device and Test Board Information
  6. 4 Irradiation Facility and Setup
  7. 5 Depth, Range and LETEFF Calculation
  8. 6 Test Setup and Procedures
  9. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  10. 8 Single-Event Transients (SET) and Single Event Functional Interrupt (SEFI)
    1. 8.1 Single Event Transient (SET)
    2. 8.2 Single Event Functional Interrupt (SEFI)
  11. 9 Event Rate Calculations
  12. 10Summary
  13.   A Appendix: Total Ionizing Dose from SEE Experiments
  14.   B Appendix: References

8.1 Single Event Transient (SET)

SETs are defined as heavy-ion-induced transients upsets on VOUT of the TPS7H2221-SEP. The species used for the SET testing was a Xenon (129Xe) ion and a Silver (109Ag) with an angle-of-incidence of 0° for an LETEFF = 42.7 and 46.8 MeV·cm2/mg, for more details refer to Section 5. Flux of approximately 104 ions/cm2·s and a fluence of approximately 3 × 106 ions/cm2 were used for the ten 129Xe SET runs. Flux of approximately 105 ions/cm2·s and a fluence of approximately 107 ions/cm2 were used for the six 109Ag SET runs.

VOUT SETs were characterized using a window trigger of ±3% around the nominal output voltage. The devices were characterized at VIN = 1.8-V, 3.3-V, and 5-V. The output load was set to either 100-mA, 500-mA, or 1.25-A using a Chroma E-Load in constant resistance (CR) mode. To capture the SETs an NI-PXIe-5172 scope card was used to continuously monitor the VOUT. The output voltage was monitored by using the TP2 (U1) and the TP7 (U2) test points on the EVM. The scope triggering from VOUT was programmed to record 50k samples with a sample rate of 10 Mega samples per second (MS/s) in case of an event (trigger). The scope was programmed to record 20% of the data before (pre) the trigger.

Under heavy-ions, the TPS7H2221-SEP exhibits transient upsets that were fully recoverable without the need for external intervention.

Test conditions and results are summarized in Table 8-1. Histograms for the VOUTSET transient time are shown in Table 8-1. There is no histogram for the VOUTSET peak percentage as all SETs dropped to 0-V before fully recovering as shown in the worst case transient image.Table 8-1 shows typical time domain plots for all of the observed SETs.

Table 8-1 Summary of TPS7H2221-SEP SET Test Condition and Results

Note that for the SET cases where the 109Ag ion was used, the total fluence per run was over 3 times as long as the runs with 129Xe which accounts for the increase in number of transients per run.

RUN # UNIT # ION LETEFF(MeV·cm2/mg) FLUX(ions·cm2/mg) FLUENCE
(# ions)		 VIN(V) LOAD (A) VOUTSET (#) ≥ ±3%

16

 1 129Xe 42.7 1.12 × 104 3 × 106

1.8

0.1

142

17

1

 129Xe 42.7 1.15 × 104 3 × 106

3.3

0.1

126

18

1

 129Xe 42.7 1.13 × 104

3 × 106

3.3

1.25

116

19

1

 129Xe 42.7

1.21 × 104

 3 × 106

5

0.1

112

20

1

 129Xe 42.7 1.10 × 104

3 × 106

5

1.25

98

21

2

 129Xe 42.7 1.19 × 104 3 × 106

1.8

0.1

138

22

2

 129Xe 42.7 1.15 × 104 3 × 106

3.3

0.1

113

23

2

 129Xe 42.7 1.13 × 104 3 × 106

3.3

1.25

130

24

2

 129Xe 42.7 1.20 × 104 3 × 106

5

0.1

103

25

2

 129Xe 42.7 1.10 × 104 2.99 × 106

5

1.25

106

26

3

109Ag

46.8

1.08 x 105

9.94 x 106

3.3

1.25

395

27

3

 109Ag 46.8 1.08 x 105

1 x 107

5

1.25

321

28

3

 109Ag 46.8 1.03 x 105 9.95 x 106

1.8

.5

472

29

4

 109Ag 46.8 1.11 x 105 9.98 x 106

3.3

1.25

377

30

4

 109Ag 46.8 1.02 x 105 9.99 x 106

5

1.25

329

31

4

 109Ag 46.8 1.09 x 105 9.98 x 106

1.8

.5

451

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross section (using a 95% confidence level) is calculated for the different SETs as shown in Table 8-2 and Table 8-2 .

Table 8-2 Upper Bound Cross Section at 95% Confidence Interval
SET TYPE

ION

VIN (V)

 # UPSETS UPPER BOUND CROSS SECTION (cm2/device)
VOUTSET ≥ |3%|

129Xe

1.8

280

5.25 x 10-5
VOUTSET ≥ |3%| 129Xe

3.3

485

4.42 x 10-5
VOUTSET ≥ |3%| 129Xe

5

419

3.84 x 10-5
VOUTSET ≥ |3%|

109Ag

 1.8

923

 5.13 x 10-5
VOUTSET ≥ |3%| 109Ag 3.3

772

 4.31 x 10-5
VOUTSET ≥ |3%| 109Ag 5

650

 3.53 x 10-5
Figure 8-1 Histogram of the Transient Time for VOUT SETs at LETEFF = 42.7 MeV·cm2/mg
Figure 8-2 Typical VOUTSET at LETEFF = 42.7 MeV·cm2/mg
Figure 8-3 Histogram of the Transient Time for VOUT SETs at LETEFF = 46.8 MeV·cm2/mg
Figure 8-4 Typical VOUTSET at LETEFF = 46.8 MeV·cm2/mg