ZHCSR57G October   1985  – April 2025 SN75179B

PRODUCTION DATA  

  1.   1
  2. 1特性
  3. 2说明
  4. 3Pin Configuration and Functions
  5. 4Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 Recommended Operating Conditions
    3. 4.3 Thermal Information
    4. 4.4 Electrical Characteristics: Driver
    5. 4.5 Switching Characteristics
    6. 4.6 Symbol Equivalent
    7. 4.7 Electrical Characteristics: Receiver
    8. 4.8 Switching Characteristics
    9. 4.9 Typical Characteristics
  6. 5Parameter Measurement Information
  7. 6Detailed Description
    1. 6.1 Functional Block Diagram
    2. 6.2 Device Functional Modes
  8. 7Device and Documentation Support
    1. 7.1 Documentation Support
      1. 7.1.1 Related Documentation
    2. 7.2 接收文档更新通知
    3. 7.3 支持资源
    4. 7.4 Trademarks
    5. 7.5 静电放电警告
    6. 7.6 术语表
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

Electrical Characteristics: Driver

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT
VIK Input clamp voltage II = –18mA –1.5 V
VO Output voltage IO = 0 0 6 V
|VOD1| Differential output voltage IO = 0 1.5 6 V
|VOD2| Differential output voltage RL = 100Ω See Figure 5-1 1/2 VOD1 V
2(2)
RL = 54Ω See Figure 5-1 1.5 2.5 5 V
|VOD3| Differential output voltage See (4) 1.5 5 V
Δ|VOD| Change in magnitude of differential output voltage ±0.2 V
VOC Common mode output voltage RL = 54Ω or 100Ω, See Figure 5-1 3 V
–1
Δ|VOC| Change in magnitude of common-mode output voltage(3) ±0.2 V
IO Output current VCC = 0 VO = -7V to 12V ±100 µA
IIH High-level input current VIH = 2.4V 20 µA
IIL Low-level input current VIL = 0.4V –200 µA
IOS Short circuit output current VO = –7V –250 mA
VO = VCC 250
VO = 12V 250
ICC Supply current (total package) No load 57 70 mA
All typical values are at VCC = 5V and TA = 25°C.
The minimum VOD2 with 100Ω load is either 1/2 VOD2 or 2V, whichever is greater
Δ|VOD| and Δ|VOC| are the changes in magnitude of VOD and VOC, respectively, that occur when the input is changed from a high level to a low level.
See TIA/EIA-485-A, Figure 3.5, Test Termination Measurement 2.