STDA026 March   2026 AFE7950-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Overview of Modern Satellite Communication Systems
    2. 1.2 Presentation of the AFE7950 as an Integrated RF Design
  5. 2Technical Advantages of AFE7950 for SATCOM Applications
    1. 2.1 Spectral Flexibility and Agility
      1. 2.1.1 Wide Frequency Range (600MHz - 12GHz)
      2. 2.1.2 Configurable Bandwidth
      3. 2.1.3 Significance of Frequency Hopping for SATCOM
      4. 2.1.4 JESD204B and JESD204C Flexibility
        1. 2.1.4.1 Subclass 1 Synchronization
        2. 2.1.4.2 Lane Reduction for Power Savings
        3. 2.1.4.3 Recommended JESD Encoding
    2. 2.2 Advantages for SATCOM System Design
    3. 2.3 Radiation Tolerance
      1. 2.3.1 AFE7950-SP: Space-Qualified Version
        1. 2.3.1.1 Total Ionizing Dose (TID)
        2. 2.3.1.2 Single Event Latch-Up (SEL)
        3. 2.3.1.3 Single Event Functional Interrupt (SEFI)
        4. 2.3.1.4 Radiation Lot Acceptance Testing
        5. 2.3.1.5 Outgassing ASTM E595 Compliance
      2. 2.3.2 Benefits for SATCOM
    4. 2.4 Power Consumption Optimization
      1. 2.4.1 Power Mode Configuration
        1. 2.4.1.1 Rx Only Mode
          1. 2.4.1.1.1 Use Case of Rx Mode
          2. 2.4.1.1.2 Benefits of Rx Mode
        2. 2.4.1.2 Typical Operation Mode
        3. 2.4.1.3 4T4R FDD Mode
          1. 2.4.1.3.1 4T4R FDD Mode Use Case
      2. 2.4.2 Power-Saving Strategies
        1. 2.4.2.1 Low Power Operation Mode
          1. 2.4.2.1.1 Standby Mode
          2. 2.4.2.1.2 Sleep Mode
      3. 2.4.3 Benefits of Sleep and Standby Mode for SATCOM
  6. 3Conclusion
  7. 4References

2.3.1.3 Single Event Functional Interrupt (SEFI)

SEFI robustness is a key concern for the AFE7950-SP. A SEFI requires power cycling and reprogramming to recover. To measure SEFIs, the beam runs for a set time based on flux (typically five minutes at 1E2). After each interval, the beam pauses and the device restores to the original state. If RX channel 1 SNR returns to the 100dB noise floor, testing continues; if not, the device is reconfigured after power cycling. The accumulated fluence is then used to calculate the SEFI cross section for the given LET.

Table 2-2 SEFI Runs
Flux (ions·cm2/s) Ion LET (MeV∙cm²/mg) Time Fluence SEFI?
1.00 × 104 Ar 9.75 25 sec 2.45 × 105 No
1.00 × 104 50 sec 4.88 × 105 No
1.00 × 104 75 sec 7.15 × 105 No
1.00 × 104 100 sec 9.53 × 105 Yes
1.00 × 102 Cu 24.54 5 min 4.43 × 104 No
1.00 × 102 10 min 8.79 × 104 No
1.00 × 102 15 min 1.28 × 105 No
1.00 × 102 20 min 1.71 × 105 No
1.00 × 102 25 min 2.16 × 105 No
1.00 × 102 30 min 2.56 × 105 No
1.00 × 102 35 min 3.00 × 105 Yes
1.00 × 102 Ag 57.73 5 min 3.92 × 104 No
1.00 × 102 20 min 1.60 × 105 No
1.00 × 102 25 min 2.00 × 105 No
1.00 × 102 30 min 2.39 × 105 Yes
Table 2-3 SET Event Rate Calculations of SEFIs for Worst-Week LEO and GEO Orbits
Orbit Type Onset LETEFF (MeV-cm2/mg) σSAT (cm2) Event Rate (/day) Event Rate (FIT) MTBE (Years)
LEO (ISS) 1 2.33 × 10–5 9.48 × 10–5 3.95 × 103 2.89 × 101
GEO 8.29 × 10–4 3.45 × 103 3.30