SNIU044A February 2020 – October 2021 LMT86-Q1
The failure mode distribution estimation for LMT86-Q1 in Table 2-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgments.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (HIZ) | 15% |
| VOUT short to VDD | 20% |
| VOUT short to GND | 20% |
| VOUT not in specification | 45% |