SLVK281 February   2026 SN54SC1G175-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Event Rate Calculations
  10. 7Summary
  11. 8References

Trademarks

National Instruments™ is a trademark of National Instruments.

All trademarks are the property of their respective owners.