SLVK237 December 2025 SN55LVRA4-SEP
5.2 Single-Event Transients (SET) Results
SETs are defined as heavy-ion-induced transient upsets on output pins 1Y and 4Z of the SN55LVRA4-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was 109Ag for a LETEFF = 47MeV × cm2 / mg. Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 were used for the SET runs.
Three units were tested across multiple input conditions to determine the worst-case setup for SETs. The unit was tested with VCC of 3V. All combinations of VCC and scope trigger configurations showed no transient upsets, as listed in Table 5-2.
To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin 2Y, and one PXI-5172 scope card was used to continuously monitor the output voltage on pin 4Y. The scope monitoring the square wave output signal was configured to a rising edge window trigger of ±5%, while the scope monitoring the static output signal was configured to a rising edge voltage trigger of ±5%. The NI scopes were programmed to a sample rate of 100M samples per second (S/s) and recorded 1000 samples, with a 20% pretrigger reference, in case of an event (trigger). The setup was verified for each run to ensure no false triggers was captured before the beam was turned on. The ±5% threshold on the static and square wave outputs was determined to be the lowest threshold capable of not providing false triggers due to noise.
Under heavy-ions, the SN55LVRA4-SEP exhibited transients on both output, 2Y and 4Y. The number of transients on each run are listed in Table 5-2.
Worst case tranisents are shown below. A few different types of transients are observed:
-
Signal Transients:
- Low Glitch: Signal glitches on a high output. Example shown in Figure 5-4. This example shows the maximum observed duration glitch with a duration of 0.04μs.
- High Glitch: Signal glitched on a low output. Example shown in Figure 5-5. This example shows the maximum observed duration glitch with a duration of 0.04μs.
- Stuck High: Signal fails to toggle to low state for one clock cycle. Example shown in Figure 5-6. This example shows the maximum observed duration glitch with a duration of 0.2μs.
- Struck Low: Signal fails to toggle to high state for one clock cycle. Example shown in Figure 5-7. This example shows the maximum observed duration glitch with a duration of 0.2μs.
| Run Number | Unit Number | Voltage Level | Ion | LETEFF (MeV × cm2/mg) | FLUX (ions × cm2/ mg) | Fluence (Number ions) | Voltage Trigger | Window Trigger | SET Upsets (OUT4) | SET Upsets (OUT2) |
|---|---|---|---|---|---|---|---|---|---|---|
| 9 | 5 | 3V | Ag | 47 | 1.00E+05 | 1.00E+07 | 5% | 20% | 188 | 504 |
| 10 | 5 | 3V | Ag | 47 | 1.00E+05 | 1.00E+07 | 5% | 5% | 164 | 554 |
| 11 | 5 | 3.3V | Ag | 47 | 1.00E+05 | 1.00E+07 | 5% | 5% | 117 | 386 |
Figure 5-4 Single Event Transient on Dynamic Signal - Low Glitch
Figure 5-5 Single Event Transient on Dynamic Signal - High Glitch
Figure 5-6 Single Event Transient on Dynamic Signal - Signal Stuck High
Figure 5-7 Single Event Transient on Dynamic Signal - Signal Stuck Low
Figure 5-8 Single Event Transient on Static Signal - Low GlitchUsing the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations, the upper-bound cross-section (using a 95% confidence level) for static outputs (OUT4) is calculated as:
Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations, the upper-bound cross-section (using a 95% confidence level) for dynamic outputs (OUT2) is calculated as: