SLVK181 January 2025 DRV8351-SEP
- 1
- Abstract
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The DRV8351-SEP is packaged in a 20-pin plastic package as shown in Figure 3-1. A DRV8351-SEP evaluation board made specifically for radiation testing was used to evaluate the performance and characteristics of the DRV8351-SEP under heavy ion radiation. The DRV8351-SEP evaluation board is shown in Figure 3-1. The board schematic is shown in Figure 3-3. Red X represents not populated
The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-1 Photograph of Delidded DRV8351-SEP
Figure 3-2 Pinout Diagram
Figure 3-3 DRV8351-SEP Evaluation Board Schematics - Device
Figure 3-4 DRV8351-SEP Evaluation Board Schematics - Power Stage
Figure 3-5 DRV8351-SEP Evaluation Board Schematics - Sense Feedback/USB2ANY
Figure 3-6 DRV8351-SEP Evaluation Board Schematics - Input Power