SLVK033A February   2019  – August 2021 INA240-SEP

 

  1.   Trademarks
  2. 1Device Information
    1. 1.1 Device Details
  3. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  4. 3Tested Parameters
  5. 4Total Ionizing Dose (RHA) Characterization Test Results
    1. 4.1 Offset Voltage
    2. 4.2 Gain Error
  6.   A Total Ionizing Dose HDR Report
  7.   B Revision History

Test Description and Facilities

The INA240-SEP HDR exposure was performed on biased devices in a Co60 gamma cell at TI SVA facility in Santa Clara, California. The unattenuated dose rate of this cell is 78 rad(Si)/s. After exposure, the devices were packed in dry ice and returned to TI Dallas for a full post irradiation electrical evaluation using Texas Instruments ATE. ATE guard band test limits are set within data sheet electrical specifications to ensure a minimum Cpk and test error margin based on initial qualification and characterization data. Post irradiation measurements were taken within 30 minutes of removal of the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post radiation measurements.