SFFSAO5 April   2026 TXE8116-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 VSSOP Package
    2. 2.2 VQFN Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 VSSOP Package
    2. 4.2 VQFN Package
  7. 5Revision History

1 Overview

This document contains information for the TXE8116-Q1 (VSSOP and VQFN) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

TXE8116-Q1 Functional Block Diagram Figure 1-1 Functional Block Diagram

The TXE8116-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.