SFFSAB7 April 2025 TPS62A02-Q1 , TPS62A02A-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS62A02-Q1 and TPS62A02A-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS62A02-Q1 and TPS62A02A-Q1 pin diagram. For a detailed description of the device pins, please refer to the 'Pin Configuration and Functions' section in the TPS62A02-Q1 and TPS62A02A-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | Intended functionality | D |
| SW | 2 | Potential device damage; incorrect output voltage | A |
| VIN | 3 | Device not functional; no power supply. | B |
| EN | 4 | Device not functional; device cannot be enabled. | B |
| FB | 5 | Incorrect output voltage; device performance degradation | B |
| PG | 6 | Loss of pin functionality; device keeps functioning | C |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | Missing ground reference; device not functional. | B |
| SW | 2 | Open loop operation; device not functional. | B |
| VIN | 3 | Device not functional; No power supply. | B |
| EN | 4 | Unintended device functionality; undefined state of pin EN. | B |
| FB | 5 | Undetermined output voltage behavior, open loop operation. | B |
| PG | 6 | Loss of pin functionality; device keeps functioning. | C |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| GND | 1 | SW | Potential device damage ; Incorrect output voltage | A |
| SW | 2 | VIN | Potential device damage ; Incorrect output voltage | A |
| VIN | 3 | EN | Intended Functionality | D |
| EN | 4 | FB | Potential device damage | A |
| FB | 5 | PG | Potential device damage | A |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | Device not functional | B |
| SW | 2 | Potential device damage; Incorrect output voltage | A |
| VIN | 3 | Intended functionality | D |
| EN | 4 | Intended functionality; Device permanently enable | D |
| FB | 5 | Potential device damage | A |
| PG | 6 | Loss of pin functionality; VIN shorted to GND with a low resistance path during start-up; Potential device damage | A |