SFFS028A June 2022 – November 2025 TMP112-Q1
Figure 4-1 shows the TMP112-Q1 and TMP112D-Q1 pin diagram for the SOT563-6 package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TMP112-Q1 and TMP112D-Q1 datasheet.
Figure 4-1 Pin Diagram (SOT563-6) Package| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SCL | 1 | The SCL pin is stuck low. I2C communication is not possible. | B |
| GND | 2 | There is no effect on the device. The device operates as normal. | D |
| ALERT | 3 | The ALERT pin is stuck low. The device is not functional, a false thermal limit triggers. | B |
| ADD0 | 4 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 5 | The device is not powered. The device is not functional. The device is potentially damaged. | A |
| SDA | 6 | The SDA pin is stuck low. I2C communication is not possible. | B |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SCL | 1 | The state of the SCL pin is undetermined. I2C communication is not possible. | B |
| GND | 2 | The functionality of the device is undetermined. The device is potentially not powered or connects to GND internally through the ESD diode of the alternate pin and powers on. | B |
| ALERT | 3 | The ALERT pin is stuck low. The device is not functional, a false thermal limit potentially triggers. | B |
| ADD0 | 4 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 5 | The device is not powered if all other pins are held low; the device is not functional. The device potentially powers up through ESD diodes to the V+ pin if voltages above the power-on reset threshold for the device are present on any of the pins of the device. | B |
| SDA | 6 | The state of the SDA pin is undetermined. I2C communication is not possible. | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| SCL | 1 | GND | The SCL pin is stuck low. I2C communication is not possible. | B |
| GND | 2 | ALERT | The ALERT pin is stuck low. The device is not functional, a false thermal limit potentially triggers. | B |
| ALERT | 3 | ADD0 | If the ADD0 pin is connected to GND, the ALERT
pin is stuck low and not functional and a thermal limit triggers. If the ADD0 pin is connected to the SCL or SDA pin, the ALERT pin toggles between high and low as communication occurs, potentially triggering thermal limits. If the ADD0 pin is connected to the V+ pin, the ALERT pin is stuck high and a thermal limit does not trigger. | B |
| ADD0 | 4 | V+ | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 5 | SDA | The SDA pin is stuck high. I2C communication is not possible. | B |
| SDA | 6 | SCL | I2C communication cannot occur, data corruption occurs. | B |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SCL | 1 | The SCL pin is stuck high. I2C communication is not possible. | B |
| GND | 2 | The functionality of the device is undetermined. The device is potentially damaged. | A |
| ALERT | 3 | The ALERT pin is stuck high. The device is not functional. Thermal limit does not trigger. | B |
| ADD0 | 4 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 5 | There is no effect on the device. The device operates as normal. | D |
| SDA | 6 | The SDA pin is stuck high. I2C communication is not possible. | B |