A Confidence Interval Calculations

For conventional products where hundreds of failures are seen during a single exposure, one can determine the average failure rate of parts being tested in a heavy-ion beam as a function of fluence with high degree of certainty and reasonably tight standard deviation, and thus have a good deal of confidence that the calculated cross-section is accurate.

With radiation-hardened parts however, it is difficult to determine the cross-section because often few or no failures are observed during an entire exposure. Determining the cross-section using an average failure rate with standard deviation is no longer a viable option, and the common practice of assuming a single error occurred at the conclusion of a null-result can end up in a greatly underestimated cross-section.

In cases where observed failures are rare or non-existent, the use of confidence intervals and the chi-squared distribution is indicated. The chi-squared distribution is particularly well-suited for the determination of a reliability level when the failures occur at a constant rate. In the case of SEE testing where the ion events are random in time and position within the irradiation area, one expects a failure rate that is independent of time (presuming that parametric shifts induced by the total ionizing dose do not affect the failure rate), and thus the use of chi-squared statistical techniques is valid (because events are rare, an exponential or Poisson distribution is usually used).

In a typical SEE experiment, the device-under-test (DUT) is exposed to a known, fixed fluence (ions/cm²) while the DUT is monitored for failures. This is analogous to fixed-time reliability testing and, more specifically, time-terminated testing where the reliability test is terminated after a fixed amount of time whether or not a failure has occurred (in the case of SEE tests fluence is substituted for time and hence it is a fixed fluence test [5]). Calculating a confidence interval specifically provides a range of values which is likely to contain the parameter of interest (the actual number of failures/fluence). Confidence intervals are constructed at a specific confidence level. For example, a 95% confidence level implies that if a given number of units were sampled numerous times and a confidence interval estimated for each test, the resulting set of confidence intervals would bracket the true population parameter in about 95% of the cases.

To estimate the cross-section from a null-result (no fails observed for a given fluence) with a confidence interval, we start with the standard reliability determination of lower-bound (minimum) mean-time-to-failure for fixed-time testing (an exponential distribution is assumed) in Equation 2:

Where:

• MTTF is the minimum (lower-bound) mean-time-to-failure,

• n is the number of units tested (presuming each unit is tested under identical conditions),

• T is the test time,

• and χ² is the chi-square distribution evaluated at 100(1 – α / 2) confidence level

• d is the degrees-of-freedom (the number of failures observed).

With slight modification for our purposes we invert the inequality and substitute F (fluence) in the place of T as shown in Equation 3:

Where:

• MFTF is mean-fluence-to-failure

• F is the test fluence

• Χ² is the chi-square distribution evaluated at 100(1 – α / 2) confidence

• d is the degrees-of-freedom (the number of failures observed).

The inverse relation between MTTF and failure rate is mirrored with the MFTF. Thus the upper-bound cross-section is obtained by inverting the MFTF as shown in Equation 4:

Assume that all tests are terminated at a total fluence of 10⁶ ions/cm². Also assume there are a number of devices with very different performances that are tested under identical conditions. Assume a 95% confidence level (σ = 0.05). Note that as d increases from 0 events to 100 events, the actual confidence interval becomes smaller, indicating that the range of values of the true value of the population parameter (in this case the cross-section) is approaching the mean value + 1 standard deviation. This makes sense when one considers that as more events are observed the statistics are improved such that uncertainty in the actual device performance is reduced.