SBOK052 May   2024 OPA4H014-SEP

 

  1.   1
  2.   OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Devices and Test Board
    2. 4.2 Characterization Devices and Test Boards
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 SEE Characterization Results: MSU FRIB Linac
    4. 5.4 Analysis
    5. 5.5 Weibull Fit
  9. 6Summary
  10.   A TAMU Results Appendix
  11.   B MSU Results Appendix
  12.   C Confidence Interval Calculations
  13.   D References

Overview

The OPA4H014-SEP is a low-power JFET input operational amplifier (op amp) that features good drift and low input bias current. With an input range that includes V– and a rail-to-rail output, designers can take advantage of the low-noise characteristics of JFET amplifiers while interfacing to single-supply, precision analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). The OPA4H014-SEP achieves 11MHz unity-gain bandwidth and 20V/μs slew rate, and consumes only 1.8mA (typical) of quiescent current. This device runs on a single 4.5V to 18V supply or dual ±2.25V to ±9V supplies.

Table 1-1 Overview Information(1)
DescriptionDevice Information
TI Part Number OPA4H014-SEP
MLS NumberOPA4H014PWSEP
DLA VID V62/21607
Device Function 11MHz, Precision, Low-Noise, RRO, JFET Amp in Space‑Enhanced Plastic
Fab TechnologyBICMOS
Fab Process BICOM-3XHV
Exposure Facilities Radiation Effects Facility, Cyclotron Institute,
Texas A&M University
Single Event Effects Facility, Facility for Rare Isotope Beams,
Michigan State University
Heavy Ion Fluence per Run1 × 107 ions/cm2
Irradiation Temperature 125°C (for SEL testing)
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