SLLS881G December 2007 – October 2014 SN65LVDS315
PRODUCTION DATA.
| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| Supply voltage range(2) | VDDIO | –0.3 | 4 | V |
| VDDD, VDDA | –0.3 | 2.175 | V | |
| Voltage range at any output terminal | –0.5 | 2.175 | V | |
| Voltage range at any input terminal | –0.5 | VDDIO + 0.5 | V | |
| Continuous power dissipation | See Thermal Information | |||
| MIN | MAX | UNIT | |||
|---|---|---|---|---|---|
| Tstg | Storage temperature range | –65 | 150 | °C | |
| V(ESD) | Electrostatic discharge | Human body model(1) (All pins) | –3 | 3 | kV |
| Charged device model(2) (All pins) | –500 | 500 | V | ||
| Machine model(3) (All pins) | –200 | 200 | |||
| MIN | NOM | MAX | UNIT | |||
|---|---|---|---|---|---|---|
| VDDIO
VDDD VDDA |
Supply voltage | 1.65 1.65 1.65 |
1.8 1.8 |
3.6 1.95 1.95 |
V | |
| VDDn(PP) | Supply voltage noise magnitude | f(VDDn(PP)) = 1 Hz to 2 GHz (test set-up see Figure 13) | 100 | mV | ||
| fDCLK | Data clock frequency | FSEL = 0, See Figure 16, Figure 17, Figure 18 | 3.5 | 13 | MHz | |
| FSEL = 1, See Figure 16, Figure 17, Figure 18 | 7 | 27 | ||||
| Standby mode (1) | 500 | kHz | ||||
| tH x fDCLK | DCLK Input duty cycle | 0.35 | 0.65 | |||
| TA | Operating free-air temperature | –40 | 85 | °C | ||
| tjit(per)DCLK | DCLK RMS period jitter(2) | Measured on DCLK input | 5 | ps-rms | ||
| tjit(TJ)DCLK | DCLK total jitter(3) | 0.05/fDCLK | s | |||
| tjit(CC)DCLK | DCLK peak cycle to cycle jitter(4) | 0.02/fDCLK | s | |||
| Icount | Number of active video lines(5) | MODE = VIH; count the number of HS↓ transitions within one frame | 1 | 2046 | ||
| thblank | Horizontal blanking time | 4 | UI (1/DCLK) |
|||
| tvblank | Vertical blanking time | 8 | UI (1/DCLK) |
|||
| DCLK, D[0:1], VS, HS | ||||||
| VIH | High-level input voltage | See Figure 7 | 0.7×VDDIO | VDDIO | V | |
| VIL | Low-level input voltage | See Figure 7 | 0 | 0.3×VDDIO | V | |
| tDS | Data set up time prior to ↑↓ DCLK | See Figure 8 | 2.0 | ns | ||
| tDH | Data hold time after ↑↓ DCLK | See Figure 8 | 2.0 | ns | ||
| MODE, TXEN | ||||||
| VIH | High-level input voltage | See Figure 7 | 0.7×VDDA | 3.6 | V | |
| VIL | Low-level input voltage | See Figure 7 | 0 | 0.3×VDDA | V | |
| FSEL | ||||||
| VIH | High-level input voltage | See Figure 7 | 0.7×VDDD | 3.6 | V | |
| VIL | Low-level input voltage | See Figure 7 | 0 | 0.3×VDDD | V | |
| THERMAL METRIC(1) | SN65LVDS315 | UNIT | |
|---|---|---|---|
| RGE | |||
| 24 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 38.2 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 41.3 | |
| RθJB | Junction-to-board thermal resistance | 16.1 | |
| ψJT | Junction-to-top characterization parameter | 0.9 | |
| ψJB | Junction-to-board characterization parameter | 16.1 | |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | 6.6 | |
| PARAMETER | TEST CONDITIONS | MIN | TYP(1) | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| IDD | Supply current | VDDIO = VDDD = VDDA, RL(CLK) = RL(D0) = 100 Ω, VIH=VDDIO, VIL=0V, TXEN and MODE at VDDD, typical blanking power test pattern. See Table 1 | FSEL = VIL, fDCLK = 3.5 MHz FSEL = VIL, fDCLK = 11 MHz FSEL = VIH, fDCLK = 11 MHz FSEL = VIH, fDCLK = 26 MHz |
4.8 7.6 5.9 9.6 |
mA | ||
| VDDIO = VDDD = VDDA, RL(CLK) = RL(D0) = 100 Ω, VIH=VDDIO, VIL=0V, TXEN and MODE at VDDD, Alternating (worst-case) 1010 serial bit pattern. See Table 2 | FSEL = VIL, fDCLK = 3.5 MHz FSEL = VIL, fDCLK = 11 MHz FSEL = VIH, fDCLK = 11 MHz FSEL = VIH, fDCLK = 26 MHz |
5.7 8.9 7.2 11.3 |
8.1 11.2 9.5 13.3 |
||||
| Standby mode (TXEN at VDD) | VDDIO = VDDD = VDDA, RL(CLK) = RL(D0) = 100 Ω, VIH=VDDIO, VIL=0 V, TXEN and MODE at VDDD, All inputs held static high (VIH) or static low (VIL) |
0.2 | 10 | μA | |||
| Shutdown mode (TXEN at GND) | 0.2 | 10 | |||||
| Standby mode (TXEN at VDD) | VDDIO = VDDD = VDDA, RL(CLK) = RL(D0) = 100 Ω, VIH=VDDIO, VIL=0 V, TXEN and Mode = VIL; D[7:0] VS, HS, and DCLK left open |
0.02 | 10 | ||||
| Shutdown mode (TXEN at GND) | 0.03 | 5 | |||||
| PD | Device power dissipation | VDDx = 1.8 V, TA = 25°C | fDCLK = 3.5 MHz fDCLK = 11 MHz fDCLK = 26 MHz |
10.8 17.7 21.2 |
mW | ||
| VDDx = 1.95 V, TA = –40°C | fDCLK = 3.5 MHz fDCLK = 26 MHz |
15.7 26.0 |
|||||
| PARAMETER | TEST CONDITIONS | MIN | TYP(1) | MAX | UNIT | |
|---|---|---|---|---|---|---|
| subLVDS OUTPUTS (DOUT+, DOUT–, CLK+, and CLK–) | ||||||
| VOCM(SS) | Steady-state common-mode output voltage | See Figure 7, Output load see Figure 11 | 0.8 | 0.925 | 1.0 | V |
| |VOD| | Differential output voltage magnitude |VDOUT+ – VDOUT– |, |VCLK+ – VCLK–| |
100 | 170 | 250 | mV | |
| Δ|VOD| | Change in differential output voltage between logic states | –10 | 10 | mV | ||
| ZOD | Differential small-signal output impedance | TXEN at VDD | 5 | kΩ | ||
| IOSD | Differential short-circuit output current | VOD = 0 V; fDCLK = 26 MHz | 1 | 10 | mA | |
| IOZ | High-impedance state output current | VO = 0 V or VDD(max), TXEN at GND | –3 | 3 | μA | |
| PARAMETER | TEST CONDITIONS | MIN | TYP(1) | MAX | UNIT | |
|---|---|---|---|---|---|---|
| Dx, VS, HS, DCLK | ||||||
| IIL(hold) | Bus hold input current(2) | VDDIO = 1.65 V and VDDIO = 3.6 V | 15 | 100 | μA | |
| IIH(hold) | Bus hold input current(3) | VDDIO = 1.65 V and VDDIO = 3.6 V | –15 | –100 | μA | |
| CIN | Input capacitance | 1.5 | pF | |||
| MODE, TXEN, FSEL | ||||||
| IIL | High-level input current | VIH = 0.7 VDDD, See Figure 7 | –200 | –0.7 | 200 | nA |
| IIH | Low-level input current | VIL = 0.3 VDDD, See Figure 7 | –200 | 0.5 | 200 | nA |
| CIN | Input capacitance | VI = TBD | 1.5 | pF | ||
| PARAMETER | TEST CONDITIONS | MIN | TYP(1) | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| tr | 20%-to-80% differential output signal rise time | fDCLK=3.5 MHz, See Figure 10 and Figure 11 | 360 | 460 | 730 | ps | |
| tf | 20%-to-80% differential output signal fall time | fDCLK=3.5 MHz, See Figure 10 and Figure 11 | 360 | 460 | 730 | ps | |
| ts(DOUT) | Setup time DOUT valid before CLK+ rising edge | See Figure 9 | FSEL = 0, fDCLK = 13 MHz FSEL = 1, fDCLK = 26 MHz |
3.327 1.163 |
4.2 1.8 |
ns | |
| th(DOUT) | Hold time DOUT valid before CLK+ ringing edge | FSEL = 0, fDCLK = 13 MHz FSEL = 1, fDCLK = 26 MHz |
4.627 2.463 |
5.4 3.0 |
ns | ||
| tpd(L) | Propagation delay time, input to serial output (data latency) | TXEN at VDDD, VIH = VDDD, VIL=GND, RL = 100 Ω, See Figure 12 |
4.5/fDCLK | 4.7/fDCLK | 5.5/fDCLK | ||
| tH x fCLKO | Output CLK duty cycle | 0.45 | 0.50 | 0.55 | |||
| tGS | TXEN glitch suppression pulse width(2) | VIH = VDDD, VIL=GND, TXEN toggles between VIL and VIH, See Figure 14 | 3.8 | 10 | μs | ||
| tpwnup | Enable time from power down (↑TXEN) | MODE at VDD; time from TXEDN pulled high to CLK and DOUT outputs enabled and transmit valid data; See Figure 14 | 100 | 100μs + 2×VS↑ | μs | ||
| tpwrdn | Disable time from active mode (↓TXEN) | TXEN is pulled low during transmit mode; time measurement until output becomes disabled and PLL is shutdown; See Figure 14 | 11 | μs | |||
| twakup | Enable time from standby (↑↓DCLK) | TXEN and MODE at VDD; device in standby; time measurement from DCLK starts switching to CLK and DOUT enabled and transmit valid data; See Figure 15 | 100 | 100μs + 2×VS↑ | μs | ||
| tsleep | Disable time from standby (DCLK stopping) | TXEN at VDD; device in transmitting; time measurement from DCLK input signal stops starts until CLK + DOUT outputs becomes disabled and PLL is shutdown, See Figure 15 | <8/fDCLK | 100 | μs | ||

| FSEL = Low |





| Through pcb interconnect of 80-inch of FR4 at 208Mbps |