ZHCSF32E February 2016 – December 2019 MSP430FR2310 , MSP430FR2311
PRODUCTION DATA.
Table 6-45 lists the Device IDs of the MSP430FR231x MCU variants. Table 6-46 lists the contents of the device descriptor tag-length-value (TLV) structure for the devices.
| DEVICE | DEVICE ID | |
|---|---|---|
| 1A04h | 1A05h | |
| MSP430FR2311 | F0 | 82 |
| MSP430FR2310 | F1 | 82 |
| DESCRIPTION | MSP430FR231x | ||
|---|---|---|---|
| ADDRESS | VALUE | ||
| Info block | Info length | 1A00h | 06h |
| CRC length | 1A01h | 06h | |
| CRC value(1) | 1A02h | Per unit | |
| 1A03h | Per unit | ||
| Device ID | 1A04h | See Table 6-45. | |
| 1A05h | |||
| Hardware revision | 1A06h | Per unit | |
| Firmware revision | 1A07h | Per unit | |
| Die record | Die record tag | 1A08h | 08h |
| Die record length | 1A09h | 0Ah | |
| Lot wafer ID | 1A0Ah | Per unit | |
| 1A0Bh | Per unit | ||
| 1A0Ch | Per unit | ||
| 1A0Dh | Per unit | ||
| Die X position | 1A0Eh | Per unit | |
| 1A0Fh | Per unit | ||
| Die Y position | 1A10h | Per unit | |
| 1A11h | Per unit | ||
| Test result | 1A12h | Per unit | |
| 1A13h | Per unit | ||
| ADC calibration | ADC calibration tag | 1A14h | Per unit |
| ADC calibration length | 1A15h | Per unit | |
| ADC gain factor | 1A16h | Per unit | |
| 1A17h | Per unit | ||
| ADC offset | 1A18h | Per unit | |
| 1A19h | Per unit | ||
| ADC 1.5-V reference, temperature 30°C(3) | 1A1Ah | Per unit | |
| 1A1Bh | Per unit | ||
| ADC 1.5-V reference, temperature 85°C(3) | 1A1Ch | Per unit | |
| 1A1Dh | Per unit | ||
| Reference and DCO calibration | Calibration tag | 1A1Eh | 12h |
| Calibration length | 1A1Fh | 04h | |
| 1.5-V reference factor | 1A20h | Per unit | |
| 1A21h | Per unit | ||
| DCO tap settings for 16 MHz, temperature 30°C (2) | 1A22h | Per unit | |
| 1A23h | Per unit | ||