ZHCST02A September   2023  – December 2023 ISOM8110

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Revision History
  6. 5 Device Selection
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Thermal Information
    4. 7.4 Insulation Specifications
    5. 7.5 Safety-Related Certifications
    6. 7.6 Safety Limiting Values
    7. 7.7 Electrical Characteristics
    8. 7.8 Switching Characteristics
    9. 7.9 Typical Characteristics
  9. 8 Parameter Measurement Information
  10. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
    4. 9.4 Device Functional Modes
  11. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Typical Application
        1. 10.1.1.1 Design Requirements
        2. 10.1.1.2 Detailed Design Procedure
        3. 10.1.1.3 Application Curves
    2. 10.2 Power Supply Recommendations
    3. 10.3 Layout
      1. 10.3.1 Layout Guidelines
      2. 10.3.2 Layout Example
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Tape and Reel Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

8 Parameter Measurement Information

GUID-20230513-SS0I-4VWL-VRRS-BDP1C1ZWKQDK-low.svg Figure 8-1 ISOM811x Test Circuit for CTR
GUID-20230513-SS0I-SRNH-8WTM-HTLSFV9DNCVM-low.svg Figure 8-2 ISOM811x Test Circuit for Switching Timing
GUID-20230513-SS0I-RTJB-BFFF-SJTNHXTSVVFS-low.svg Figure 8-3 ISOM811x Switching Timing Waveforms
GUID-20230513-SS0I-49KB-XFCJ-BVHZ4LJJKSTX-low.svg Figure 8-4 ISOM811(0-3) Test Circuit for Bandwidth
GUID-20230513-SS0I-D0RB-KFZQ-FSTRS6VWBKNS-low.svg Figure 8-5 ISOM811(5-8) Test Circuit for Bandwidth