ZHCSQX4F August   1995  – August 2022 UC1823A , UC1825A , UC2823A , UC2823B , UC2825A , UC2825B , UC3823A , UC3823B , UC3825A , UC3825B

PRODUCTION DATA  

  1. 1特性
  2. 2说明
  3. 3Revision History
  4. 4Ordering Information
  5. 5Pin Configuration and Functions
    1.     Terminal Functions
  6. 6Specifications
    1. 6.1 ABSOLUTE MAXIMUM RATINGS
    2. 6.2 Thermal Information
    3. 6.3 ELECTRICAL CHARACTERISTICS
    4. 6.4 ELECTRICAL CHARACTERISTICS
  7. 7Application and Implementation
    1. 7.1 LEADING EDGE BLANKING
    2. 7.2 UVLO、软启动和故障管理
    3. 7.3 ACTIVE LOW OUTPUTS DURING UVLO
    4. 7.4 CONTROL METHODS
    5. 7.5 SYNCHRONIZATION
    6. 7.6 HIGH CURRENT OUTPUTS
    7. 7.7 GROUND PLANES
    8. 7.8 OPEN LOOP TEST CIRCUIT
  8. 8Device and Documentation Support
    1. 8.1 Documentation Support
    2. 8.2 接收文档更新通知
    3. 8.3 支持资源
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 术语表
  9. 9Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • DW|16
散热焊盘机械数据 (封装 | 引脚)
订购信息

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)
VALUEUNIT
VINSupply voltage,VC, VCC22V
IOSource or sink current,DCOUTA, OUTB0.5A
IOSource or sink current, pulse (0.5 μs)OUTA, OUTB2.2A
Analog inputsINV, NI, RAMP–0.3 to 7V
ILIM, SS–0.3 to 6V
Power groundPGND±0.2V
ICLKClock output currentCLK/LEB–5mA
IO(EA)Error amplifier output currentEAOUT5mA
ISSSoft-start sink currentSS20mA
IOSCOscillator charging currentRT–5mA
TJOperating virtual junction temperature range–55 to 150°C
TstgStorage temperature–65 to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds–55 to 150°C
tSTGStorage temperature–65 to 150°C
Lead temperature 1,6 mm (1/16 inch) from cases for 10 seconds300°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.