ZHCSH60C June   2017  – October 2018 OPA1692

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1. 3 线制驻极体麦克风的前置放大器
      2.      THD + N 与频率之间的关系（3 VRMS，2kΩ 负载）
  4. 4 修订历史记录
  5. 5 Pin Configuration and Functions
    1.     Pin Functions: OPA1692
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA1692
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Distortion Reduction
      2. 7.3.2 Phase Reversal Protection
      3. 7.3.3 Electrical Overstress
    4. 7.4 Device Functional Modes
      1. 7.4.1 Operating Voltage
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitive Loads
      2. 8.1.2 Noise Performance
      3. 8.1.3 Basic Noise Calculations
      4. 8.1.4 EMI Rejection
      5. 8.1.5 EMIRR +IN Test Configuration
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Other Application Examples
      1. 8.3.1 Two-Wire Electret Microphone Preamplifier
      2. 8.3.2 Battery-Powered Preamplifier for Professional Microphones
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
    3. 10.3 Power Dissipation
  11. 11器件和文档支持
    1. 11.1 器件支持
      1. 11.1.1 开发支持
        1. 11.1.1.1 TINA-TI™（免费软件下载）
        2. 11.1.1.2 DIP 适配器 EVM
        3. 11.1.1.3 通用运算放大器评估模块 (EVM)
        4. 11.1.1.4 智能放大器扬声器特性鉴定板评估模块
        5. 11.1.1.5 TI 高精度设计
        6. 11.1.1.6 WEBENCH滤波器设计器
    2. 11.2 文档支持
      1. 11.2.1 相关文档
    3. 11.3 相关链接
    4. 11.4 接收文档更新通知
    5. 11.5 社区资源
    6. 11.6 商标
    7. 11.7 静电放电警告
    8. 11.8 术语表
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

8.1.5 EMIRR +IN Test Configuration

Figure 59 shows the circuit configuration for testing the EMIRR IN+. An RF source connects to the op amp noninverting input pin using a transmission line. The op amp is configured in a unity-gain buffer topology with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM). A large impedance mismatch at the op amp input causes a voltage reflection; however, this effect is characterized and accounted for when determining the EMIRR IN+. A multimeter samples and measures the resulting DC offset voltage. The LPF isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.

OPA1692 EMIRR_Test_CKT_SBOS079.gifFigure 59. EMIRR +IN Test Configuration