首頁 電源管理 序列器
首頁
電源管理
序列器

TPS7H3014-SP

現行

抗輻射 QMLV、14V 四通道電源供應序列器

立即訂購
產品規格表

TPS7H3014-SP

現行
產品規格表 立即訂購

產品詳細資料

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults

  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults

  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.
filter 尋找其它 序列器
下載 觀看有字幕稿的影片 影片

技術文件

star =TI 所選的此產品重要文件
找不到結果。請清除您的搜尋條件，然後再試一次。
檢視所有 12
類型 標題 日期
* Data sheet TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML 2025年 7月 27日
* SMD TPS7H3014-SP SMD 5962-23201 2024年 6月 20日
* Radiation & reliability report TPS7H3014-SP Single-Event Effects (SEE) PDF | HTML 2024年 6月 12日
* Radiation & reliability report TPS7H3014-SP Neutron Displacement Damage (NDD) Characterization Report 2024年 4月 4日
* Radiation & reliability report TPS7H3014-SP Total Ionizing Dose (TID) Report 2024年 4月 4日
Application brief DLA Approved Optimizations for QML Products (Rev. C) PDF | HTML 2025年 6月 17日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. B) PDF | HTML 2025年 6月 10日
Selection guide TI Space Products (Rev. K) 2025年 4月 4日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 2025年 2月 20日
Application note QML flow, its importance, and obtaining lot information (Rev. C) 2023年 8月 30日
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 2020年 8月 21日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

TPS7H3014EVM-CVAL — TPS7H3014-SP 評估模組

TPS7H3014EVM-CVAL 展示了單一 TPS7H3014-SP 序列器的操作。電路板提供可裝入其他元件的元件封裝，以便進行自訂配置測試，例如菊輪鍊序列器。
使用指南: PDF | HTML
TI.com 無法提供
開發板

ALPHA-3P-VB630-SPACE-AMD — Alpha Data ADM-VB630 套件，使用 AMD Versal 核心 XQRVE2302 ACAP 和 TI 耐輻射產品

外型尺寸採用 3U VPX，突显 AMD-Xilinx® Versal AI Core XQRVE2302 適應性 SoC/FPGA。VB630 是 單板計算機板。零組件多數為耐輻射電源管理、介面、時脈與嵌入式處理裝置。

從：Alpha Data Parallel Systems Ltd.
造訪合作夥伴網站
模擬型號

TPS7H3014-SP and TPS7H3014-SEP PSpice Transient Model

SNVMCF1.ZIP (72 KB) - PSpice Model
下載
模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI 是有助於評估類比電路功能的設計和模擬環境。這款全功能設計和模擬套件使用 Cadence® 的類比分析引擎。PSpice for TI 包括業界最大的模型庫之一，涵蓋我們的類比和電源產品組合，以及特定類比行為模型，且使用無需支付費用。

PSpice for TI 設計和模擬環境可讓您使用其內建函式庫來模擬複雜的混合訊號設計。在進行佈局和製造之前，建立完整的終端設備設計和解決方案原型，進而縮短上市時間並降低開發成本。 

在 PSpice for TI 設計與模擬工具中，您可以搜尋 TI (...)
要求
參考設計

TIDA-050088 — 適用於 Versal AI Edge 的耐輻射電源參考設計

這是針對 AMD Versal™ AI Edge XQRVE2302 所設計的耐輻射電源架構參考設計。Versal Edge 是適用於航太應用的採用型系統單晶片 (SoC)，能以小尺寸實現高效能。穩固的電力輸送是在航太環境中充分運用此設計的關鍵。此電源設計採用多個裝置為各種軌供電，並搭配時序控制器，來適當排序及監控軌。
Design guide: PDF
封裝 針腳 CAD 符號、佔位空間與 3D 模型
CFP (HFT) 22 Ultra Librarian
適用 TI 的評估品項標準條款與條件。

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

以英文檢視所有論壇主題

內容係由 TI 和社群貢獻者依「現狀」提供，且不構成 TI 規範。檢視使用條款。

若有關於品質、封裝或訂購 TI 產品的問題，請參閱 TI 支援。​​​​​​​​​​​​​​

影片