DRV3245E-Q1
- AEC-Q100 qualified for automotive applications:
- Device
temperature grade 0:
–40°C to +150°C, TA
- Device
temperature grade 0:
- SafeTI™semiconductor component
- Developed according to the applicable requirements of ISO 26262
- 4.5-V to 45-V operating voltage
- Programmable peak gate drive currents up to 1A
- Charge-pump gate driver for 100% Duty Cycle
- Current-shunt amplifiers and phase comparators
- A Device: 3 current-shunt amplifiers and 3-phase comparators with status through SPI
- B Device: 2 current-shunt amplifiers and 3-phase comparators with real-time monitor through digital pins
- 3-PWM or 6-PWM input control up to 20 kHz
- Single PWM-mode commutation capability
- Supports both 3.3-V and 5-V digital interface
- Serial peripheral interface (SPI)
- Thermally-enhanced 48-Pin HTQFP
- Protection features:
- Internal regulators, battery voltage monitor
- SPI CRC
- Clock monitor
- Analog built-in self test
- Programmable dead-time control
- MOSFET shoot-through prevention
- MOSFET VDS overcurrent monitors
- Gate-source voltage real time monitor
- Overtemperature warning
The DRV3245E-Q1 device is a FET gate driver IC for three-phase motor-drive applications. The device is intended for high-temperature automotive applications and is designed according to the applicable requirements of ISO 26262 for functional safety applications. The device provides three half-bridge drivers each capable of driving a high-side and low-side N-channel MOSFET while also providing sophisticated protection and monitoring of the FETs. A charge-pump driver enables 100% duty cycle and supports low battery voltages during cold-crank operation. The integration of current-sense amplifiers, integrated phase comparators, and SPI-based configuration enable reduction of the bill of materials (BOM) and space on the printed circuit board (PCB) because of the elimination of most external and passive components.
The DRV3245E-Q1 device also integrates diagnostics and protection for each internal block and provides support for common system diagnostic checks each of which can be instantiated and reported through SPI. This flexibility of the integrated features allows the device to integrate seamlessly into a variety of safety architectures.
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技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | DRV3245E-Q1 3-Phase Grade 0 Automotive Gate Driver Unit (GDU) With High Performance Sensing, Protection and Diagnostics datasheet | PDF | HTML | 2019/3/29 | ||
| 應用說明 | Best Practices for Board Layout of Motor Drivers (Rev. B) | PDF | HTML | 2021/10/14 |
設計與開發
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BOOSTXL-DRV3245AQ1 — DRV3245Q-Q1 車用三相馬達閘極驅動器評估模組
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| HTQFP (PHP) | 48 | Ultra Librarian |