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TLC2543-EP

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具有串行控制和 11 路模拟输入的增强型产品 12 位模数转换器 (ADC)

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TLC2543-EP

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产品详情

Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm) SSOP (DB) 20 56.16 mm² (7.2 mm × 7.8 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
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技术文档

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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 TLC2543-EP 数据表 (Rev. A) 2006-11-2
* 辐射与可靠性报告 TLC2543MDBREP Reliability Report 2016-2-16
* 辐射与可靠性报告 TLC2543QDWREP Reliability Report 2014-12-22
* VID TLC2543-EP VID V6203614 2016-6-21
电子书 Best of Baker's Best: Precision Data Converters -- SAR ADCs 2015-5-21
应用手册 Determining Minimum Acquisition Times for SAR ADCs, part 2 2011-3-17

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ADC-DAC-TO-VREF-SELECT-DESIGN-TOOL — The ADC-TO-VREF-SELECT tool enables the pairing of TI ADCs, DACs, and series voltage references.

The ADC-TO-VREF-SELECT tool enables the pairing of TI analog-to-digital converters (ADCs) and series voltage references. Users can select an ADC device and the desired reference voltage, and the tool will list up to two voltage reference recommendations.
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SOIC (DW) 20 Ultra Librarian
SSOP (DB) 20 Ultra Librarian
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