主页 逻辑和电压转换 缓冲器、驱动器和收发器 同相缓冲器和驱动器
主页
逻辑和电压转换
缓冲器、驱动器和收发器
同相缓冲器和驱动器

SN74LVC1G17-EP

正在供货

具有施密特触发输入的单通道 1.65V 至 6.5V 缓冲器（增强型产品）

立即订购
数据表

SN74LVC1G17-EP

正在供货
数据表 立即订购

产品详情

Technology family LVC Number of channels 1 IOL (max) (mA) 32 Supply current (max) (µA) 10 IOH (max) (mA) -32 Input type Schmitt-Trigger Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family LVC Number of channels 1 IOL (max) (mA) 32 Supply current (max) (µA) 10 IOH (max) (mA) -32 Input type Schmitt-Trigger Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOT-SC70 (DCK) 5 4.2 mm² (2 mm × 2.1 mm) SOT-23 (DBV) 5 8.12 mm² (2.9 mm × 2.8 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Qualification Pedigree(1)
  • Supports 5-V VCC Operation
  • Max tpd of 4.6 ns at 3.3 V
  • Low Power Consumption, 10 µA Max ICC
  • ±24 mA Output Drive at 3.3 V
  • Ioff Supports Partial Power Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

NanoStar, NanoFree are trademarks of Texas Instruments.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Qualification Pedigree(1)
  • Supports 5-V VCC Operation
  • Max tpd of 4.6 ns at 3.3 V
  • Low Power Consumption, 10 µA Max ICC
  • ±24 mA Output Drive at 3.3 V
  • Ioff Supports Partial Power Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

NanoStar, NanoFree are trademarks of Texas Instruments.

This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G17 contains one buffer and performs the Boolean function Y = A. The device functions as an independent buffer, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT-) signals.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G17 contains one buffer and performs the Boolean function Y = A. The device functions as an independent buffer, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT-) signals.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
filter 查找其他 同相缓冲器和驱动器
下载 观看带字幕的视频 视频

技术文档

未找到结果。请清除搜索并重试。
查看全部 4
顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 Single Schmitt-Trigger Buffer 数据表 (Rev. A) 2007-6-29
* 辐射与可靠性报告 SN74LVC1G17MDBVREP Reliability Report (Rev. A) 2012-6-6
* 辐射与可靠性报告 SN74LVC1G17MDCKREP Reliability Report 2012-5-7
* VID SN74LVC1G17-EP VID V6206621 2016-6-21

设计与开发

如需其他信息或资源，请点击以下任一标题进入详情页面查看（如有）。

封装 引脚 CAD 符号、封装和 3D 模型
SOT-SC70 (DCK) 5 Ultra Librarian
SOT-23 (DBV) 5 Ultra Librarian
适用于评估类项目的 TI 标准条款与条件。

订购和质量

支持和培训

可获得 TI 工程师技术支持的 TI E2E™ 论坛

查看全部论坛主题 查看英文版全部论坛主题

所有内容均由 TI 和社区贡献者按“原样”提供，并不构成 TI 规范。请参阅使用条款。

如果您对质量、包装或订购 TI 产品有疑问，请参阅 TI 支持。​​​​​​​​​​​​​​

视频