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SN74AHC00-EP

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增强型产品 4 通道、2 输入、2V 至 5.5V 与非门

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SN74AHC00-EP

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数据表 立即订购

产品详情

Technology family AHC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AHC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm) SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 Quadruple 2-Input Positive-NAND Gate 数据表 2002-7-23
* 辐射与可靠性报告 SN74AHC00MDREP Reliability Report 2016-8-9
* VID SN74AHC00-EP VID V6203604 2016-6-21

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