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LM211-EP

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LM211-EP

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Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Rating HiRel Enhanced Product Features Strobe, Vos Adj Pin Iq per channel (typ) (mA) 5.1 Vos (offset voltage at 25°C) (max) (mV) 3 Rail-to-rail No Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 100 VICR (max) (V) 28 VICR (min) (V) 0.5
Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Rating HiRel Enhanced Product Features Strobe, Vos Adj Pin Iq per channel (typ) (mA) 5.1 Vos (offset voltage at 25°C) (max) (mV) 3 Rail-to-rail No Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 100 VICR (max) (V) 28 VICR (min) (V) 0.5
SOIC (D) 8 29.4 mm² (4.9 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.
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顶层文档 类型 标题 格式选项 下载最新的英语版本 日期
* 数据表 LM211-EP 数据表 (Rev. A) 2006-2-22
* 辐射与可靠性报告 LM211MDREP Reliability Report 2012-5-7
* VID LM211-EP VID V6203638 2016-6-21
电子书 The Signal e-book: 有关运算放大器设计主题的博客文章汇编 PDF | HTML 英语版 PDF | HTML 2018-1-31

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评估板

AMP-PDK-EVM — 放大器高性能开发套件评估模块

放大器高性能开发套件 (PDK) 是一款用于测试常见运算放大器参数的评估模块 (EVM) 套件，与大多数运算放大器和比较器均兼容。该 EVM 套件提供了一个主板，主板上具有多个插槽式子卡选项以满足封装需求，使工程师能够快速评估和验证器件性能。

AMP-PDK-EVM 套件支持五种常用的业界通用封装，包括：

  • D（SOIC-8 和 SOIC-14）
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV（SOT23-5 和 SOT23-6）
  • DCK（SC70-5 和 SC70-6）
用户指南: PDF | HTML
支持的产品和硬件
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SOIC (D) 8 Ultra Librarian
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