TLV2553 处于停产状态
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功能与比较器件相同且具有相同引脚
TLV2553-Q1 正在供货 具有断电功能的汽车类 12 位 200KSPS 11 通道低功耗串行 ADC Automotive version
功能与比较器件相似
ADS7952 正在供货 12 位、1MSPS、12 通道、单端、微功耗、串行接口、SAR ADC Higher speed, higher channel count
ADS8686S 正在供货 具有集成模拟前端 (AFE) 的 16 通道 16 位 1MSPS 双路同步采样 ADC Higher resolution, higher speed, higher channel count

产品详情

Resolution (Bits) 12 Sample rate (max) (ksps) 200 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating Catalog Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Features Oscillator Operating temperature range (°C) -40 to 85 Power consumption (typ) (mW) 2.43 Analog supply (min) (V) 2.7 Analog supply voltage (max) (V) 5.5 SNR (dB) 69.5 Digital supply (min) (V) 2.7 Digital supply (max) (V) 5.5
Resolution (Bits) 12 Sample rate (max) (ksps) 200 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating Catalog Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Features Oscillator Operating temperature range (°C) -40 to 85 Power consumption (typ) (mW) 2.43 Analog supply (min) (V) 2.7 Analog supply voltage (max) (V) 5.5 SNR (dB) 69.5 Digital supply (min) (V) 2.7 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² 12.8 x 10.3 TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • 12-Bit-Resolution A/D Converter
  • Up to 200 KSPS (150 KSPS for 3 V) Throughput
    Over Operating Temperature Range With 12-Bit
    Output Mode
  • 11 Analog Input Channels
  • 3 Built-In Self-Test Modes
  • Inherent Sample and Hold Function
  • Linearity Error, ±1 LSB Maximum
  • On-Chip Conversion Clock
  • Unipolar or Bipolar Output Operation
  • Programmable MSB or LSB First
  • Programmable Power Down
  • Programmable Output Data Length
  • SPI Compatible Serial Interface With I/O Clock
    Frequencies up to 15 MHz (CPOL=0, CPHA=0)
  • 12-Bit-Resolution A/D Converter
  • Up to 200 KSPS (150 KSPS for 3 V) Throughput
    Over Operating Temperature Range With 12-Bit
    Output Mode
  • 11 Analog Input Channels
  • 3 Built-In Self-Test Modes
  • Inherent Sample and Hold Function
  • Linearity Error, ±1 LSB Maximum
  • On-Chip Conversion Clock
  • Unipolar or Bipolar Output Operation
  • Programmable MSB or LSB First
  • Programmable Power Down
  • Programmable Output Data Length
  • SPI Compatible Serial Interface With I/O Clock
    Frequencies up to 15 MHz (CPOL=0, CPHA=0)

The TLV2553 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter. The ADC has three control inputs [chip select (CS), the input-output clock, and the address/control input (DATAIN)], designed for communication with the serial port of a host processor or peripheral through a serial 3-state output.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any one of 11 inputs or any one of three internal self-test voltages using configuration register 1. The sample-and-hold function is automatic. At the end of conversion, when programmed as EOC, the pin 19 output goes high to indicate that conversion is complete. The converter incorporated in the device features differential, high- impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLV2553I is characterized for operation from TA = –40°C to 85°C.

The TLV2553 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter. The ADC has three control inputs [chip select (CS), the input-output clock, and the address/control input (DATAIN)], designed for communication with the serial port of a host processor or peripheral through a serial 3-state output.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any one of 11 inputs or any one of three internal self-test voltages using configuration register 1. The sample-and-hold function is automatic. At the end of conversion, when programmed as EOC, the pin 19 output goes high to indicate that conversion is complete. The converter incorporated in the device features differential, high- impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLV2553I is characterized for operation from TA = –40°C to 85°C.

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类型 标题 下载最新的英语版本 日期
* 数据表 TLV2553 12-Bit, 200-KSPS, 11-Channel, Low-Power, Serial ADC 数据表 (Rev. C) PDF | HTML 2015年 7月 9日
EVM 用户指南 TLV2553EVM-PDK User's Guide (Rev. A) 2019年 9月 13日
电子书 Best of Baker's Best: Precision Data Converters -- SAR ADCs 2015年 5月 21日
应用手册 Determining Minimum Acquisition Times for SAR ADCs, part 2 2011年 3月 17日
应用手册 Determining Minimum Acquisition Times for SAR ADCs, part 1 (Rev. A) 2010年 11月 10日

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评估板

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The interface board consists of two signal conditioning sites, two serial EVM sites, and a parallel EVM site. Regardless of the interface type, all EVMs compatible with the 5-6K Interface Board have a standard analog interface and standard power connector. Three position screw terminals J1 and (...)

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评估板

TLV2553EVM-PDK — TLV2553 评估模块

TLV2553EVM-PDK 是用于评估 TLV2553 逐次逼近型寄存器模数转换器 (SAR ADC) 的性能的平台。该评估套件包括 TLV2553EVM 电路板、简易采集卡控制器板并附带计算机软件。借助该软件,用户便可通过通用串行总线 (USB) 与 ADC 进行通信,并可采集数据和执行数据分析。

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支持的产品和硬件

支持的产品和硬件

产品
精密 ADC
TLV2553 具有断电功能的 12 位 200KSPS 11 通道低功耗串行 ADC TLV2553-Q1 具有断电功能的汽车类 12 位 200KSPS 11 通道低功耗串行 ADC
硬件开发
评估板
TLV2553EVM-PDK TLV2553 评估模块
仿真模型

TLV2553IPW IBIS Model (Rev. A)

SBAC058A.ZIP (47 KB) - IBIS Model
计算工具

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TINA 是德州仪器 (TI) 专有的 DesignSoft 产品。该免费版本具有完整的功能,但不支持完整版 TINA 所提供的某些其他功能。

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用户指南: PDF
下载英文版本 (Rev.A): PDF
封装 引脚 下载
SOIC (DW) 20 查看选项
TSSOP (PW) 20 查看选项

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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