产品详情

Configuration Serial-in, Parallel-out Bits (#) 8 Technology family HCS Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Schmitt-Trigger Output type Push-Pull Clock frequency (MHz) 62 IOL (max) (mA) 7.8 IOH (max) (mA) -7.8 Supply current (max) (µA) 2 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating Automotive
Configuration Serial-in, Parallel-out Bits (#) 8 Technology family HCS Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Schmitt-Trigger Output type Push-Pull Clock frequency (MHz) 62 IOL (max) (mA) 7.8 IOH (max) (mA) -7.8 Supply current (max) (µA) 2 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating Automotive
SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • AEC-Q100 Qualified for automotive applications:
    • Device temperature grade 1: –40°C to +125°C, TA
    • Device HBM ESD Classification Level 2
    • Device CDM ESD Classifcation Level C6
  • Wide operating voltage range: 2 V to 6 V
  • Schmitt-trigger inputs allow for slow or noisy input signals
  • Low power consumption
    • Typical ICC of 100 nA
    • Typical input leakage current of ±100 nA
  • 7.8-mA output drive at 6 V
  • AEC-Q100 Qualified for automotive applications:
    • Device temperature grade 1: –40°C to +125°C, TA
    • Device HBM ESD Classification Level 2
    • Device CDM ESD Classifcation Level C6
  • Wide operating voltage range: 2 V to 6 V
  • Schmitt-trigger inputs allow for slow or noisy input signals
  • Low power consumption
    • Typical ICC of 100 nA
    • Typical input leakage current of ±100 nA
  • 7.8-mA output drive at 6 V

The device contains an 8-bit shift register with AND-gated serial inputs and an asynchronous clear (CLR) input. Data at the serial inputs can be changed while CLK is high or low, provided the minimum setup time requirements are met. All inputs include Schmitt-trigger architecture, adding noise margin and eliminating any input transition rate requirement. Clocking occurs on the low-to-high-level transition of CLK.

Upon a clock trigger, the device will store the result of the (A ● B) input data line in the first register and propagate each register’s data to the next register. The outputs are inverted from the data stored.

The device contains an 8-bit shift register with AND-gated serial inputs and an asynchronous clear (CLR) input. Data at the serial inputs can be changed while CLK is high or low, provided the minimum setup time requirements are met. All inputs include Schmitt-trigger architecture, adding noise margin and eliminating any input transition rate requirement. Clocking occurs on the low-to-high-level transition of CLK.

Upon a clock trigger, the device will store the result of the (A ● B) input data line in the first register and propagate each register’s data to the next register. The outputs are inverted from the data stored.

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类型 标题 下载最新的英语版本 日期
* 数据表 SN74HCS264-Q1 汽车 8 位并行输出串行移位寄存器 数据表 2020年 7月 13日

设计和开发

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评估板

14-24-LOGIC-EVM — 采用 14 引脚至 24 引脚 D、DB、DGV、DW、DYY、NS 和 PW 封装的逻辑产品通用评估模块

14-24-LOGIC-EVM 评估模块 (EVM) 旨在支持采用 14 引脚至 24 引脚 D、DW、DB、NS、PW、DYY 或 DGV 封装的任何逻辑器件。

用户指南: PDF | HTML
英语版 (Rev.B): PDF | HTML
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仿真模型

SN74HCS264 IBIS Model

SCEM773.ZIP (51 KB) - IBIS Model
封装 引脚 下载
SOIC (D) 14 查看选项
TSSOP (PW) 14 查看选项

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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