SN74AHC00-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product Change Notification Qualification Pedigree
- EPIC™ (Enhanced-Performance Implanted CMOS) Process
EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
The SN74AHC00 performs the Boolean function Y = (A B)\ or Y = A\ + B\ in positive logic.
您可能感兴趣的相似产品
功能与比较器件相同但引脚有所不同
技术文档
未找到结果。请清除搜索并重试。
查看全部 24 设计和开发
如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。
封装 | 引脚 | 下载 |
---|---|---|
SOIC (D) | 14 | 查看选项 |
TSSOP (PW) | 14 | 查看选项 |
订购和质量
包含信息:
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
包含信息:
- 制造厂地点
- 封装厂地点