68-pin (GB) package image

SNJ54ACT8990GB 正在供货

测试总线控制器

正在供货 barcode 批次/生产日期 可提供批次和生产日期代码选项
等同于: 5962-9322801MYA 该器件型号与上面所列的器件型号相同。您只能订购该器件型号的上述数量。

定价

数量 价格
+

其他包装数量 | 包装选项 这些产品完全相同,仅包装类型不同

5962-9322801MYA 正在供货 barcode 批次/生产日期 可提供批次和生产日期代码选项
包装数量 | 包装 21 | JEDEC TRAY (5+1)
库存
数量 | 价格 100u | +

质量信息

等级 Military
RoHS
REACH 受影响
引脚镀层/焊球材料 SNPB
MSL 等级/回流焊峰值温度 Level-NC-NC-NC
质量、可靠性
和封装信息

包含信息:

  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
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更多制造信息

包含信息:

  • 制造厂地点
  • 封装厂地点
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出口管制分类

*仅供参考

  • 美国 ECCN:EAR99

封装信息

封装 | 引脚 CPGA (GB) | 68
工作温度范围 (°C) -55 to 125
包装数量 | 包装 21 | JEDEC TRAY (5+1)

SN54ACT8990 的特性

  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • Control Operation of Up to Six Parallel Target Scan Paths
  • Accommodate Pipeline Delay to Target of Up to 31 Clock Cycles
  • Scan Data Up to 232 Clock Cycles
  • Execute Instructions for Up to 232 Clock Cycles
  • Each Device Includes Four Bidirectional Event Pins for Additional Test Capability
  • Inputs Are TTL-Voltage Compatible
  • EPICTM (Enhanced-Performance Implanted CMOS) 1-m Process
  • Packaged in 44-Pin Plastic Leaded Chip Carrier (FN), 68-Pin Ceramic Pin Grid Array (GB), and 68-Pin Ceramic Quad Flat Packages (HV)

    SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

SN54ACT8990 的说明

The 'ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies. The 'ACT8990 differ from other SCOPETM integrated circuits. Their function is to control the JTAG serial-test bus rather than being target boundary-scannable devices.

The required signals of the JTAG serial-test bus - test clock (TCK), test mode select (TMS), test data input (TDI), and test data output (TDO) can be connected from the TBC to a target device without additional logic. This is done as a chain of IEEE Standard 1149.1-1990 boundary-scannable components that share the same serial-test bus. The TBC generates TMS and TDI signals for its target(s), receives TDO signals from its target(s), and buffers its test clock input (TCKI) to a test clock output (TCKO) for distribution to its target(s). The TMS, TDI, and TDO signals can be connected to a target directly or via a pipeline, with a retiming delay of up to 31 bits. Since the TBC can be configured to generate up to six separate TMS signals [TMS (5-0)], it can be used to control up to six target scan paths that are connected in parallel (i.e., sharing common TCK, TDI, and TDO signals).

While most operations of the TBC are synchronous to TCKI, a test-off (TOFF\) input is provided for output control of the target interface, and a test-reset (TRST\) input is provided for hardware/software reset of the TBC. In addition, four event [EVENT (3-0)] I/Os are provided for asynchronous communication to target device(s). Each event has its own event generation/detection logic, and detected events can be counted by two 16-bit counters.

The TBC operates under the control of a host microprocessor/microcontroller via the 5-bit address bus [ADRS (4-0)] and the 16-bit read/write data bus [DATA (15-0)]. Read (RD\) and write (WR\) strobes are implemented such that the critical host-interface timing is independent of the TCKI period. Any one of 24 registers can be addressed for read and/or write operations. In addition to control and status registers, the TBC contains two command registers, a read buffer, and a write buffer. Status of the TBC is transmitted to the host via ready (RDY\) and interrupt (INT\) outputs.

Major commands can be issued by the host to cause the TBC to generate the TMS sequences necessary to move the target(s) from any stable test-access-port (TAP) controller state to any other stable TAP state, to execute instructions in the Run-Test/Idle TAP state, or to scan instruction or test data through the target(s). A 32-bit counter can be preset to allow a predetermined number of execution or scan operations.

Serial data that appears at the selected TDI input (TDI1 or TDI0) is transferred into the read buffer, which can be read by the host to obtain up to 16 bits of the serial-data stream. Serial data that is transmitted from the TDO output is written by the host to the write buffer.

 

The SN54ACT8990 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ACT8990 is characterized for operation from 0°C to 70°C.

 

 

 

 

 

NC - No internal connection

定价

数量 价格
+

其他包装数量 | 包装选项 这些产品完全相同,仅包装类型不同

5962-9322801MYA 正在供货 barcode 批次/生产日期 可提供批次和生产日期代码选项
包装数量 | 包装 21 | JEDEC TRAY (5+1)
库存
数量 | 价格 100u | +

包装方式

您可以根据器件数量选择不同的包装方式,包括完整卷带、定制卷带、剪切带、管装或托盘。

定制卷带是从整盘卷带上剪下来的具有连续长度的剪切带,是一种可以对特定数量提供产品批次及生产日期跟踪的包装方式。根据行业标准,使用黄铜垫片在剪切带两端各连接一个 18 英寸的引带和尾带,以直接送入自动组装机。涉及定制卷带的 TI 订单将包含卷带费用。

剪切带是从整盘卷带上剪下来的特定长度的编带。根据所申请器件数量的不同,TI 可能会使用多条剪切带或多个盒子进行包装。

TI 通常会根据库存情况选择将管装托盘器件以盒装或者管装或托盘形式发货。所有器件均会按照 TI 内部规定的静电放电和湿敏等级保护要求进行包装。

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可提供批次和生产日期代码选项

您可在购物车中添加器件数量以开始结算流程,并查看现有库存中可选择批次或生产日期代码的选项。

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