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D 型锁存器

CY74FCT2573T

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具有三态输出和串联阻尼电阻的八路 D 类透明锁存器

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CY74FCT2573T

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产品详情

Number of channels 8 Technology family FCT Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 12 IOH (max) (mA) -12 Supply current (max) (µA) 200 Features Balanced outputs, Damping resistors, Flow-through pinout, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 8 Technology family FCT Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 12 IOH (max) (mA) -12 Supply current (max) (µA) 200 Features Balanced outputs, Damping resistors, Flow-through pinout, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 85 Rating Catalog
SOIC (DW) 20 131.84 mm² 12.8 x 10.3 SSOP (DBQ) 20 51.9 mm² 8.65 x 6
  • Function and Pinout Compatible With the Fastest Bipolar Logic
  • 25- Output Series Resistors Reduce Transmission-Line Reflection Noise
  • Reduced VOH (Typically = 3.3 V) Version of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • 3-State Outputs
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • Fully Compatible With TTL Input and Output Logic Levels
  • 12-mA Output Sink Current
    15-mA Output Source Current
  • Function and Pinout Compatible With the Fastest Bipolar Logic
  • 25- Output Series Resistors Reduce Transmission-Line Reflection Noise
  • Reduced VOH (Typically = 3.3 V) Version of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • 3-State Outputs
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • Fully Compatible With TTL Input and Output Logic Levels
  • 12-mA Output Sink Current
    15-mA Output Source Current

The CY74FCT2573T is an 8-bit, high-speed CMOS, TTL-compatible buffered latch with 3-state outputs that is ideal for driving high-capacitance loads, such as memory and address buffers. On-chip 25- termination resistors at the outputs reduce system noise caused by reflections. The CY74FCT2573T can replace the CY74FCT573T to reduce noise in an existing design.

When the latch-enable (LE) input is high, the flip-flops appear transparent to the data. Data that meets the required setup times are latched when LE transitions from high to low. Data appears on the bus when the output-enable (OE\) input is low. When OE\ is high, the bus output is in the high-impedance state. In this mode, data can be entered into the latches.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The CY74FCT2573T is an 8-bit, high-speed CMOS, TTL-compatible buffered latch with 3-state outputs that is ideal for driving high-capacitance loads, such as memory and address buffers. On-chip 25- termination resistors at the outputs reduce system noise caused by reflections. The CY74FCT2573T can replace the CY74FCT573T to reduce noise in an existing design.

When the latch-enable (LE) input is high, the flip-flops appear transparent to the data. Data that meets the required setup times are latched when LE transitions from high to low. Data appears on the bus when the output-enable (OE\) input is low. When OE\ is high, the bus output is in the high-impedance state. In this mode, data can be entered into the latches.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
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类型 标题 下载最新的英语版本 日期
* 数据表 8-Bit Latch With 3-State Outputs 数据表 2001年 10月 11日
应用手册 Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022年 12月 15日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
选择指南 《高级总线接口逻辑器件选择指南》 英语版 2010年 7月 7日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 选择正确的电平转换解决方案 (Rev. A) 英语版 (Rev.A) 2006年 3月 23日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用户指南 CYFCT Parameter Measurement Information 2001年 4月 2日

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用户指南: PDF | HTML
英语版 (Rev.B): PDF | HTML
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  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
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