产品详情

Configuration Universal Bits (#) 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 8.5 IOL (max) (mA) 4.2 IOH (max) (mA) -4.2 Supply current (max) (µA) 3000 Features Balanced outputs, Positive input clamp diode, Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Military
Configuration Universal Bits (#) 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 8.5 IOL (max) (mA) 4.2 IOH (max) (mA) -4.2 Supply current (max) (µA) 3000 Features Balanced outputs, Positive input clamp diode, Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Military
CDIP (J) 16 135.3552 mm² 19.56 x 6.92
  • 4-Stage clocked shift operation
  • Synchronous parallel entry on all 4 stages
  • JK\ inputs on first stage
  • Asynchronous True/Complement control on all outputs
  • Static flip-flop operation; Master-slave configuration
  • Buffered inputs and outputs
  • High speed — 12 MHz (typ.) at VDD = 10 V
  • 100% tested for quiescent current at 20 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13A, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications:
    • Counters, Registers
      • Arithmetic-unit registers
      • Shift-left — shift right registers
      • Serial-to-parallel/parallel-to-serial conversions
    • Sequence generation
    • Control circuits
    • Code conversion

  • 4-Stage clocked shift operation
  • Synchronous parallel entry on all 4 stages
  • JK\ inputs on first stage
  • Asynchronous True/Complement control on all outputs
  • Static flip-flop operation; Master-slave configuration
  • Buffered inputs and outputs
  • High speed — 12 MHz (typ.) at VDD = 10 V
  • 100% tested for quiescent current at 20 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13A, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications:
    • Counters, Registers
      • Arithmetic-unit registers
      • Shift-left — shift right registers
      • Serial-to-parallel/parallel-to-serial conversions
    • Sequence generation
    • Control circuits
    • Code conversion

CD4035B is a four-stage clocked signal serial register with provision for synchronous PARALLEL inputs to each stage and SERIAL inputs to the first stage via JK\ logic. Register stages 2, 3, and 4 are coupled in a serial D flip-flop configuration when the register is in the serial mode (PARALLEL/SERIAL control low).

Parallel entry into each register stage is permitted when the PARALLEL/SERIAL control is high.

In the parallel or serial mode information is transferred on positive clock transitions.

When the TRUE/COMPLEMENT control is high, the true contents of the register are available at the output terminals. When the TRUE/COMPLEMENT control is low, the outputs are the complements of the data in the register. THe TRUE/COMPLEMENT control functions asynchronously with respect to the CLOCK signal.

JK\ input logic is provided on the first stage SERIAL input to minimize logic requirements particularly in counting and sequence-generation applications. With JK\ inputs connected together, the first stage becomes a D flip-flop. An asynchronous common RESET is also provided.

The CD4035B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4035B is a four-stage clocked signal serial register with provision for synchronous PARALLEL inputs to each stage and SERIAL inputs to the first stage via JK\ logic. Register stages 2, 3, and 4 are coupled in a serial D flip-flop configuration when the register is in the serial mode (PARALLEL/SERIAL control low).

Parallel entry into each register stage is permitted when the PARALLEL/SERIAL control is high.

In the parallel or serial mode information is transferred on positive clock transitions.

When the TRUE/COMPLEMENT control is high, the true contents of the register are available at the output terminals. When the TRUE/COMPLEMENT control is low, the outputs are the complements of the data in the register. THe TRUE/COMPLEMENT control functions asynchronously with respect to the CLOCK signal.

JK\ input logic is provided on the first stage SERIAL input to minimize logic requirements particularly in counting and sequence-generation applications. With JK\ inputs connected together, the first stage becomes a D flip-flop. An asynchronous common RESET is also provided.

The CD4035B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

下载 观看带字幕的视频 视频

技术文档

star =有关此产品的 TI 精选热门文档
未找到结果。请清除搜索并重试。
查看全部 10
类型 标题 下载最新的英语版本 日期
* 数据表 CD4035B TYPES 数据表 (Rev. C) 2003年 10月 15日
* SMD CD4035B-MIL SMD 8101701EA 2016年 6月 21日
应用手册 Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022年 12月 15日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用户指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
应用手册 Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日

设计和开发

如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。

封装 引脚 CAD 符号、封装和 3D 模型
CDIP (J) 16 Ultra Librarian

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

视频