ZHCSTX5C August   2000  – January 2025 OPA627 , OPA637

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information: OPA627
    5. 5.5 Thermal Information: OPA637
    6. 5.6 Electrical Characteristics: OPA627BU, OPA627AU
    7. 5.7 Electrical Characteristics: OPA627AM, OPA627BM, OPA627SM
    8. 5.8 Electrical Characteristics: OPA637
    9. 5.9 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Offset Voltage Adjustment
      2. 6.3.2 Noise Performance
      3. 6.3.3 Input Bias Current
      4. 6.3.4 Phase-Reversal Protection
      5. 6.3.5 Output Overload
      6. 6.3.6 Capacitive Loads
      7. 6.3.7 Input Protection
      8. 6.3.8 EMI Rejection Ratio (EMIRR)
        1. 6.3.8.1 EMIRR IN+ Test Configuration
      9. 6.3.9 Settling Time
    4. 6.4 Device Functional Modes
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curve
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
        1. 8.1.1.1 TINA-TI™ 仿真软件(免费下载)
        2. 8.1.1.2 模拟滤波器设计器
        3. 8.1.1.3 TI 参考设计
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 接收文档更新通知
    4. 8.4 支持资源
    5. 8.5 Trademarks
    6. 8.6 静电放电警告
    7. 8.7 术语表
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

静电放电警告

OPA627 OPA637 静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。