8 Single-Event Transients (SET)

SET are defined as heavy-ion-induced transients upsets on the GATE (OUTH and OUTL tied together) of the TPS7H503x-SP.

Testing was performed at room temperature (no external temperature control applied). The heavy-ions species used for the SET testing was ¹⁶⁹Tm at 19.5MeV/nucleon (for more details refer to Table 5-1). Flux of approximately 10⁵ions/cm²/s and a fluence of approximately 10⁷ions/cm², per run were used for the SET characterization discussed in this chapter.

Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.

Open-Loop Configuration

The primary focus of SETs were heavy-ion-induced transient upsets on output signal GATE (OUTH and OUTL tied together). SET testing was done at room temperature at ¹⁶⁹Tm which produced a LET_EFF of 75MeV×cm²/mg. GATE was monitored using a NI PXIe-5110 and SS was monitored using a NI PXIe-5172. During testing the scope was set to trigger if the signal exceeded |20%| from nominal using a pulse width trigger. During all SET testing, TPS7H503x-SP is SEFI free and there was one type of SET recorded on GATE that was self-recoverable. SS was SET and SEFI free.

The SET results for 4 devices (the same 4 devices used for DSEE) are shown below in the following tables. The transient signature on GATE is shown and the number of transients across the runs, voltages, and frequencies is shown. Since only this transient signature occurred there is high confidence that the TPS7H503x-SP is SEFI free and the recorded transient signature does not show any overshoot.

The upper-bound cross-sections for all bias conditions are shown in Figure 8-1.

Figure 8-1 Largest Observed GATE Positive Pulse-Width Transient

Figure 8-2 Smallest Observed GATE Negative Pulse-Width Transient

Figure 8-3 GATE Pulse-Width Deviation Histogram (All Runs)