SLVK146 august   2023 TPS7H2211-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2211-SEP eFuse
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A
  15.   B References

7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

During the SEB/SEGR characterization, the device was tested at room temperature ≈ 25°C. The die temperature was verified using a FLIR IR-camera.

The species used for the SEB testing was a Silver (109Ag) ion with an angle-of-incedence of 0° for an LETEFF = 48 MeV·cm2/mg (for more details, see Depth, Range, and LETEFF CalculationTest Setup and ProceduresSingle-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) ResultsSingle-Event Transients (SET)Depth, Range, and LETEFF CalculationEvent Rate Calculations). The kinetic energy in the vacuum for these ions is 1.634 GeV (15-MeV/amu line). Flux of approximately 105 ions/cm2·s and a fluence of approximately 107 ions/cm2 were used for the 6 runs. Run duration to achieve this fluence was approximately 2 minutes (per 1 × 107 ions·cm2). The TPS7H2211-SP was tested under enabled and disabled modes. The device was disabled by forcing 0 V on the EN pin with an SMU. The E-Load was connected, even when the device was disabled, to help differentiate if an SET momentarily activated the device under the heavy-ion irradiation. During SEB and SEGR testing using the 109Ag ion with the device disabled/enabled no VOUT transient or input current event was observed. This indicates that the TPS7H2211-SP is SEB and SEGR On-free, up to LETEFF = 48 MeV·cm2/mg.Table 8-3 shows the SEB test conditions and results. Figure 7-2 shows a plot of the current vs time for run 4 (enabled) and Figure 7-3 for run 5 (disabled).

Table 7-2 Summary of TPS7H2211-SEP SEB Test Condition and Results For all runs the device was loaded with ≈ 3.5 amps.
Run Number Unit Number Ion LETEFF (MeV·cm2/mg) Flux (ions·cm2/s) Fluence(ions·cm2) VIN (V) EN?
4 1 109Ag 48 1.11 × 105 1.00 × 107 14 Yes
5 1 109Ag 48 1.00 × 105 1.00 × 107 14 No
6 2 109Ag 48 1.02 × 105 1.00 × 107 14 Yes
7 2 109Ag 48 1.03 × 105 1.00 × 107 14 No
8 3 109Ag 48 8.57 × 104 1.00 × 107 14 Yes
9 3 109Ag 48 1.20 × 105 1.00 × 107 14 No

Using the MFTF method described in SLVK047 and combining (or summing) the fluences of the runs with the same categories as described on the columns the SEB/SEGR upper-bound cross-section (using a 95% confidence level) is calculated as:

σ S E B   ≤ 6.15   x   10 - 8 c m 2 d e v i c e f o r   L E T E F F = 48   M e V ∙ c m 2 m g a n d   T = 25 ° C
GUID-20230810-SS0I-X290-2W2F-J6GCPS5BJ8G2-low.svg Figure 7-2 Current vs Time for Run # 4 (Enabled) for the TPS7H2211-SEP at T = 25°C
GUID-20230810-SS0I-CKMF-1Z1G-X7MLGPDNDKNZ-low.svg Figure 7-3 Current vs Time for Run # 5 (Disabled) for the TPS7H2211-SEP at T = 25°C