SLVAG00 January   2026 BZX84C15V

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Zener Operation and Key Parameters
    1. 2.1 Operation
      1. 2.1.1 Device Operation Under Breakdown
    2. 2.2 Key Parameters
  6. 3Zener Diode Manufacturing Process
    1. 3.1 Manufacturing
      1. 3.1.1 Wafer Fabrication
      2. 3.1.2 Complete Manufacturing Flow
      3. 3.1.3 Process Control and Capability
  7. 4Why Choose TI Zener Diodes?
  8. 5Selecting the Correct Protection Diode
    1. 5.1 Zener Diode
    2. 5.2 ESD Diode
    3. 5.3 TVS Diode
  9. 6Typical Applications
    1. 6.1 Zener Diode
      1. 6.1.1 Voltage Regulation
      2. 6.1.2 MOSFET Gate Overvoltage Clamping
      3. 6.1.3 CAN Bus Overvoltage Protection
    2. 6.2 ESD Diode
    3. 6.3 TVS Diode
  10. 7Summary
  11. 8References

Device Operation Under Breakdown

When a PN diode is subjected to a reverse bias higher than the breakdown voltage (VZ), the diode can conduct a large amount of current. Alternatively, the PN diode can hold the voltage to VZ when a fixed current is forced through the diode in reverse bias condition. This behavior of the PN diode can provide a fixed voltage clamp for a wide range of currents and can be used as a crude voltage reference or voltage clamp for circuit protection. There are two major physical phenomena that lead to PN diode breakdown, namely, avalanche breakdown and zener breakdown as shown in Figure 2-2. Irrespective of the breakdown mechanisms at play, the commercially available diodes are colloquially called 'Zener' diodes.

Avalanche breakdown results from impact ionization by high-energy electrons in the depletion region. Every electron that enters the depletion region can multiply and generate exponentially more electron-hole pairs that result in a sudden increase in the current when bias is VZ or higher in the reverse bias. Zener breakdown results from tunneling of valence electrons from p-region to n-region through silicon bandgap under extremely high junction electric fields. Zener breakdown typically occurs for the PN diodes that are heavily doped in both p- and n-type regions. Avalanche breakdown typically occurs for larger voltages (>6V) whereas zener breakdown primarily occurs at lower bias (approximately 2-5V). Both breakdown phenomena are reversible as long as the PN diode does not undergo a thermal breakdown due to excessive current.

 Two Major Breakdown Phenomena
                    in PN Diode Under Reverse Bias Figure 2-2 Two Major Breakdown Phenomena in PN Diode Under Reverse Bias