SFFSB23 December 2025 TPS62A2I4-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a failure mode analysis (FMA) for the pins of the TPS62A2I4-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to VIN (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TPS62A2I4-Q1 pin diagram. For a detailed description of the device pins, please refer to the Pin Configuration and Functions section in the TPS62A2I4-Q1 data sheet.
Figure 4-1 Pin DiagramFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
- The device is operating in the typical application. Please refer to the Simplified Schematics in the TPS62A2I4-Q1 datasheet.
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SCL | 1 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
| VSET | 2 | The device powers up with the wrong output voltage. | B |
| SW | 3 | The device is potentially damaged. | A |
| 4 | |||
| PG | 5 | There is no damage to the device, but loss of functionality occurs. | B |
| VOS | 6 | There is no damage to the device, but loss of functionality occurs. | B |
| AGND | 7 | The device functions as intended. | D |
| PGND | 8 | The device functions as intended. | D |
| 13 | |||
| VIN | 9 | The device does not power up. | B |
| 10 | |||
| EN | 11 | The device does not power up. | B |
| SDA | 12 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SCL | 1 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
| VSET | 2 | The device powers up with the wrong output voltage. | B |
| SW | 3 | The device powers up and operates if either the 3 or 4 pin is still connected. The performance parameters are potentially degraded. | C |
| 4 | |||
| PG | 5 | There is no damage to the device, but loss of functionality occurs. | B |
| VOS | 6 | There is no damage to the device, but the output voltage can be out of regulation. | B |
| AGND | 7 | The device powers up. | C |
| PGND | 8 | The device powers up and operates if either the 8 or 13 pin is still connected. The performance parameters are potentially degraded. | C |
| 13 | |||
| VIN | 9 | The device powers up and operates if either the 9 or 10 pin is still connected. The performance parameters are potentially degraded. | C |
| 10 | |||
| EN | 11 | If the device is not intended to be disabled, the device does not power up. | B |
| SDA | 12 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| SCL | 1 | VSET | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
| VSET | 2 | SW | The device powers up but potentially regulates to the wrong output voltage. | B |
| SW | 3 | PG | The device is potentially damaged. | A |
| 4 | ||||
| PG | 5 | VOS | There is a loss of PG functionality. | B |
| VOS | 6 | AGND | There is no damage to the device, but the output voltage can be out of regulation. | B |
| AGND | 7 | PGND | The device powers up and performance parameters are potentially degraded. | C |
| PGND | 8 | VIN | The device does not power up. | B |
| 13 | ||||
| VIN | 9 | EN | The device is always enabled. | B |
| 10 | ||||
| EN | 11 | SDA | The device is potentially not enabled properly depending on the SDA level. | B |
| SDA | 12 | SCL | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
Table 4-5 Pin FMA for Device Pins Short-Circuited to VIN
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class FSET |
|---|---|---|---|
| SCL | 1 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |
| VSET | 2 | The device powers up but potentially regulates to the wrong output voltage. | B |
| SW | 3 | The device is potentially damaged. | A |
| 4 | |||
| PG | 5 | The device is potentially damaged. | A |
| VOS | 6 | The output voltage can be out of regulation; the device is potentially damaged. | A |
| AGND | 7 | The device does not power up. | B |
| PGND | 8 | The device does not power up. | B |
| 13 | |||
| VIN | 9 | The device functions as intended. | D |
| 10 | |||
| EN | 11 | The device is always enabled, but there is a loss of functionality. | B |
| SDA | 12 | The device powers up, but I2C communication is potentially not possible and the device potentially regulates to a wrong output voltage. | B |