SFFSAY1 October   2025 LM51261A-Q1 , LM5126A-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 VQFN Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 LM5126A-Q1 (VQFN) Package
    2. 4.2 LM51261A-Q1 (VQFN) Package
  7. 5Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM5126A-Q1 and LM51261A-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
HO gate driver is stuck on5
LO gate driver is stuck on
HO gate driver is stuck off15
LO gate driver is stuck off
HO gate driver is Hi-Z5
LO gate driver is Hi-Z
VCC LDO output voltage is out of specification 20
VOUT voltage is out of specification 35
PGOOD/nFAULT false or fails to trip 10
Digital control malfunctions, or electrical parameters are out of specification 10