SFFSAX8 December 2025 LMH6551Q-Q1
The failure mode distribution estimation for LMH6551Q-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT+
open VOUT- open | 20 |
| VOUT+
to VS- VOUT- to VS- | 20 |
| VOUT+
to VS+ VOUT- to VS+ | 20 |
| VOUT+ or VOUT- functional, not in specification | 35 |
| Pin-to-pin short, any two pins | 5 |