SFFSAU5A March 2026 – May 2026 UCC27624V-Q1
The failure mode distribution estimation for the UCC27624V-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| OUTA stuck high | 7 |
| OUTA stuck low | 7 |
| OUTA functioning out of specification | 7 |
| OUTB stuck high | 7 |
| OUTB stuck low | 7 |
| OUTB functioning out of specification | 7 |
| ENA stuck high | 7 |
| ENA stuck low | 7 |
| ENA functioning out of specification | 7 |
| ENB stuck high | 7 |
| ENB stuck low | 7 |
| ENB functioning out of specification | 7 |
| UVLO false reporting | 13 |
| Test mode | EMI performance | 3 |