SFFSA66 July 2025 LM51770-Q1
The failure mode distribution estimation for the LM51770-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| HO1/2 or LO1/2 gate driver is stuck on | 10 |
| HO1/2 or LO1/2 gate driver is stuck off | 20 |
| HO1/2 or LO1/2 gate driver is Hi-Z | 5 |
| VCC LDO output voltage out of specification | 5 |
| Vout voltage out of specification | 30 |
| Average current out of specifications | 5 |
| Digital control malfunctions or electrical parameters out of
specification NFLT false or fails to trip |
25 |