SFFSA16A October   2024  – May 2025 INA745A-Q1 , INA745B-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 3x5 QFN Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 3x5 QFN Package
  7. 5Revision History

Overview

This document contains information for INA74X-Q1 (INA745A and INA745B in 3x5 QFN package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

INA74XQ1 INA74XQ1 INA740 INA740A INA740B INA741 INA745 INA745A INA745B INA746 INA780 INA780A INA780B INA781 Functional Block
                    Diagram Figure 1-1 Functional Block Diagram

INA74X-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.