SFFS924A August 2024 – February 2025 SN74LV4051A-Q1 , SN74LV4052A-Q1 , SN74LV4053A-Q1
4.1 SN74LV4051A-Q1: TSSOP, SOIC, and SOT-23-THIN Packages
Figure 4-1 and Figure 4-2 show the SN74LV405xA-Q1 pin diagrams for the TSSOP, SOIC, and SOT-23-THIN packages. For a detailed description of the device pins, see the Pin Configuration and Functions section in the SN74LV405xA-Q1 data sheet.
Figure 4-1 Pin Diagram TSSOP and SOIC Packages
Figure 4-2 Pin Diagram SOT-23-THIN PackageTable 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| Y4 | 1 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y6 | 2 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| COM | 3 | Corruption of the signal passed on to the Y pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y7 | 4 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y5 | 5 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| INH | 6 | INH stuck low. Can no longer disable the device without power down. | B |
| GND | 7 | No effect, normal operation. | D |
| GND | 8 | No effect, normal operation. | D |
| C | 9 | Address stuck low. Cannot control switch states. | B |
| B | 10 | Address stuck low. Cannot control switch states. | B |
| A | 11 | Address stuck low. Cannot control switch states. | B |
| Y3 | 12 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y0 | 13 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y1 | 14 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y2 | 15 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Vcc | 16 | Device is not powered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| Y4 | 1 | Corruption of the signal passed on to the COM pin. | B |
| Y6 | 2 | Corruption of the signal passed on to the COM pin. | B |
| COM | 3 | Corruption of the signal passed on to the Y pins. | B |
| Y7 | 4 | Corruption of the signal passed on to the COM pin. | B |
| Y5 | 5 | Corruption of the signal passed on to the COM pin. | B |
| INH | 6 | Loss of control of the INH pin. Cannot turn off the device. | B |
| GND | 7 | Device not powered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| GND | 8 | Device not powered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| C | 9 | Control of the address pin is lost. Cannot control switch. | B |
| B | 10 | Control of the address pin is lost. Cannot control switch. | B |
| A | 11 | Control of the address pin is lost. Cannot control switch. | B |
| Y3 | 12 | Corruption of the signal passed on to the COM pin. | B |
| Y0 | 13 | Corruption of the signal passed on to the COM pin. | B |
| Y1 | 14 | Corruption of the signal passed on to the COM pin. | B |
| Y2 | 15 | Corruption of the signal passed on to the COM pin. | B |
| Vcc | 16 | Device is not powered. Device is not functional. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| Y4 | 1 | Y6 | Possible corruption of the signal passed on to the COM pin. | B |
| Y6 | 2 | COM | Possible corruption of the signal passed on to the YX and COM pin. | B |
| COM | 3 | Y7 | Possible corruption of the signal passed on to the YX and COM pin. | B |
| Y7 | 4 | Y5 | Possible corruption of the signal passed on to the COM pin. | B |
| Y5 | 5 | INH | Possible corruption of the signal passed on to the COM pin. Switch state is undefined. | B |
| INH | 6 | GND | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| GND | 7 | GND | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| GND | 8 | C | Not considered, corner pin. | D |
| C | 9 | B | Control of the address pin is lost. Cannot control switch. | B |
| B | 10 | A | Control of the address pin is lost. Cannot control switch. | B |
| A | 11 | Y3 | Control of the address pin is lost. Cannot control switch. | B |
| Y3 | 12 | Y0 | Corruption of the signal passed on to the COM pin. | B |
| Y0 | 13 | Y1 | Corruption of the signal passed on to the COM pin. | B |
| Y1 | 14 | Y2 | Corruption of the signal passed on to the COM pin. | B |
| Y2 | 1 | VCC | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Vcc | 16 | Y4 | Not considered, corner pin. | D |
Table 4-5 Pin FMA for Device Pins Short-Circuited to Vcc
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| Y4 | 1 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y6 | 2 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| COM | 3 | Corruption of the signal passed on to the Y pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y7 | 4 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y5 | 5 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| INH | 6 | INH stuck high. Can no longer enable the device. | B |
| GND | 7 | Device is not powered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| GND | 8 | Device is not powered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| C | 9 | Address stuck high. Cannot control switch. | B |
| B | 10 | Address stuck high. Cannot control switch. | B |
| A | 11 | Address stuck high. Cannot control switch. | B |
| Y3 | 12 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y0 | 13 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y1 | 14 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Y2 | 15 | Corruption of the signal passed on to the COM pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| Vcc | 16 | No effect, normal operation. | D |